Abstract:For the novelties or anomalies of faulty signals occur in a damage circuit and fault signals vary with different circuit damages. To ensure the accuracy, and reliability of diagnosis, it is very important to extract the characteristic features of fault signals. Two feature extraction methods based on wavelet packet transform is proposed to treat transient signals: optimal wavelet packet transform (OWPT) and incomplete wavelet packet transform (IWPT). For the fault signals decomposed, the energy in each frequency band may be heightened or be reduced, so a novel 'energy-fault' method is put forward to extract fault features. The problem of fault diagnosis of analog circuit is actually a pattern recognition problem. Nowadays, the binary free support v;ector machines (BTSVMs) is usually used for multi-class classification, but the structure of the binary tree is closely related to the classification performance of binary tree support vector machines (BTSVMs). A new separability measure method based on the space distribution of pattern classes is applied to construct different binary trees. Three BTSVMs classifiers based on the separability measure are defined in this paper: inclined binary tree Support vector machines (IBTSVMs), balanced binary tree support vector machines (BBTSVMs) and adaptive binary tree support vector machines (ABTSVMs). Simulation results show us that the OWPT method is prefect for soft fault diagnosis, the IWPT for hard fault diagnosis, and the BBTSVMs multi-classifier possesses better classification speed, the ABTSVMs multi-classifer better classification accuracy.

Optimum test points selection in analogue-circuit diagnosis with graphic fault detection and isolation information record

Test Points Selection for Analog Fault Dictionary Techniques

Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

Test Point Selection Method for Hierarchical Fault Diagnosis

Algorithms Comparation Of Feature Extraction And Multi-Class Classification For Fault Diagnosis Of Analog Circuit

A New Test Point Selection Method for Analog Continuous Parameter Fault

Multidimensional Fitness Function DPSO Algorithm for Analog Test Point Selection

Selection of Global Minimal Test Points Set for Integer-Coded Fault Wise Table

New Minimum Test Point Set Selection Algorithm Based on Heuristic Graph Search

Test point selection based on chaotic multi-objective DPSO algorithm

Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis

Joint Distribution-Based Test Selection for Fault Detection and Isolation Under Multiple Faults Condition

Simplified Entropy and Multidimensional Search for Test Points Selection

Conditional Joint Distribution-Based Test Selection for Fault Detection and Isolation

Design of Test Points Selection and Test Sequencing Problem of Multivalued Fault Dictionary

Simulation Studies of Test Nodes Selection for Soft Fault Diagnosis in Analog Circuits

Data-driven Optimal Test Selection Design for Fault Detection and Isolation Based on CCVKL Method and PSO

Testability design based on relevance of circuit nodes and fault diagnosis

On soft fault diagnosis method based HHT for analog circuits.

FAULT DIAGNOSIS FOR ANALOG CIRCUITS WITH TOLERANCE—MINIMUM TOLERANCE ESTIMATION ALGORITHM

Geometric Methods of Faults Isolation for Analog Diagnosis with Tolerance