Abstract:Analog test point selection aims at finding the minimal test point set and obtains the highest fault isolation rate (FIR).Almost all previous researches considered the highest FIR as a constraint and proposed many methods to find the minimal test point set.Of course a higher FIR is better,but practically,especially in large analog circuits,to obtain the highest FIR usually takes a great deal of time and money.Quite often,if just to obtain an approximate highest FIR,the expense of time and money can be greatly reduced.Therefore,in this paper,a novel chaotic multi-objective discrete particle swarm algorithm is proposed for analog test point selection.This method finds more solutions than previous methods because it uses Pareto optimality theory to solve the test selection and it compares the solutions according to Pareto dominance.Each particle maintains a Pareto set as personal best,and global best is also a Pareto set.To improve its global-searching ability,chaos technique is applied in this method. The experimental results showed the following:1 )The proposed method found not only the solutions with the highest FIR,but also found the solutions with approximate highest FIR;2)It found the minimal test point set for each FIR;3 )Compared with other multi-objective algorithms,the proposed method achieved the highest accuracy, found the most solutions and consumed a shorter time.It can provide more solutions with different FIR for circuit designers to choose,which is beneficial for design-for-testability and fault diagnosis.

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