EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures

Zulfiqar A. Khan,Yakup Bayram,John L. Volakis
DOI: https://doi.org/10.1109/TEMC.2008.921030
IF: 2.036
2008-01-01
IEEE Transactions on Electromagnetic Compatibility
Abstract:This paper presents a series of measurements to study various electromagnetic compatibility (EMC)/electromagnetic interference (EMI) coupling scenarios, frequently encountered in electronic systems. Specifically, field penetration through apertures and coupling of penetrating wires onto the printed circuit boards (PCBs) enclosed by resonant structures are considered. In contrast to other measureme...
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