Study of the Relationship Between the V-I Curve and the Flux Dynamics in Superconductors
YH Zhang,ZH Wang,H Luo,XF Wu,HM Luo,Z Xu,SY Ding
DOI: https://doi.org/10.1088/0953-8984/13/11/314
2001-01-01
Journal of Physics Condensed Matter
Abstract:The equivalence of the experimental V-I characteristic (V proportional to I-m) and the material E-j curve (E proportional to j(n)) was studied. We show numerically that only when the current I is larger than I-hom, the fully penetrating current, can the V-I curve be equivalent to the E-j one and thus be used to determine the material parameter n, whereas if I < I-hom, j is inhomogeneous and the V-I curve is not appropriate for use in probing the properties of the sample. The inhomogeneity of j can be checked by simply measuring the voltage relaxation curve at a given I. Furthermore, it is shown that I-hom varies with dI/dt and n. The dependence of I-hom on dI/dt indicates that current cannot go directly into a homogeneous region in practical transport measurements. Moreover, we argue that ail of the V-I curves with different values of the flux-creep barrier exponent merge at large current. Since current is probably inhomogeneous in the small-current region, the V-I curve might not be appropriate for use in studying the properties of the sample in this region. Therefore, the V-I curve may not be appropriate for determining mu in the U-j relation at all sensitively.