Abstract:Although diffraction analysis of photochromic optical disks becomes increasingly essential, the traditional diffraction theories are not applicable to the case, because the disks are not pit/land-recorded as these theories assumes. This paper presents a diffraction theory of photochromic disks based on Fourier transforms, by modeling the disk as a transmittance-relief grating, and discussed its applicability to multi-wavelength memory. Regarding the information character as convolution integral of a round spot and the track of the writing spot, we can get the transmittance distribution function by means of superposition method. Utilizing the experiment system of photochromic optical disks developed by the National Engineering Research Center, we compared the experimental readouts to the calculating results and proved that when the writing energy is low or medium, experimental curves accord with theoretical results, while too high writing energy may cause recording spot's center to reach saturated stage of photochromic reaction. In this case, the linear relationship between transmittance rate and writing time won't hold, and the superposition method doesn't apply to overlapped components, either. Therefore, theoretical results differ from real curves. But we can still fit the reaction characteristic curve with traverse linear function, and obtain the transmittance distribution function and the readouts of the disks.

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Thermal Deformation Analysis of High-Density Optical Disks

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Analysis of the Optical Channel of a Photochromic Multi-Level Optical Disc

Thermal Analysis of Multi Track Phase Change Optical Recording Using A Special Parallel Recording Array Head

Thickness Error Analysis Of Multilayers For Recordable And Phase-Change Optical Disks

Theoretical And Experimental Study Of Readouts Of Photochromic Optical Disks

Analytical Model of Thermal Field in Polymer Thermo-Optic Devices

Analysis of Readouts in Photochromic Multi-Wavelength Memory

Effects of Latent Heat and Incident Beam Distribution on the Temperature Field in Phase Change Recording

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