A New Pairwise Covering Test Data Generation Algorithm for the System with Many 2-Level Factors

Changhai Nie,XU Bao-Wen,SHI Liang
DOI: https://doi.org/10.3321/j.issn:0254-4164.2006.06.001
2006-01-01
Chinese Journal of Computers
Abstract:Pairwise testing is very practical and effective.Much research has been done in the test data generation algorithm.The authors first study pairwise testing data generated for SM2(System with Many 2-level factors) with the existed methods,then present a new algorithm by combinatorial analysis to avoid the shortages that the existed methods are not good enough for SM2.This algorithm can generate the most effective test suite with smaller size.The authors use the result to test the Linux code and design the test plan for the software configuration testing.It shows the test data generated by the algorithm has high code coverage and fault-detection ability.
What problem does this paper attempt to address?