Combinatorial Design Approaches for Automatic Test Generation

Shi Liang,Xu Baowen,Nie Changhai
DOI: https://doi.org/10.1007/bf02688150
2005-01-01
Journal of Electronics (China)
Abstract:The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a new parameters, every combination of valid values of arbitrary n(n≥2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.
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