Abstract:The structure of the optimal binary pairwise covering arrays is studied, and the algorithm to rapidly generate the pairwise test data of a general software is proposed. The algorithm first generates the basic block B(0, 1) and the reduced block R(0, 1), then generates the corresponding block B(a, b) or R(a, b) by substitution to cover each value pair (a, b), and finally obtains the pairwise covering array by vertically concatenating these blocks. So the obtained covering array is optimal when the software under test is binary, and the covering array is near optimal when each factor has small size set of discrete valid value. The time complexity of the algorithm is O(klog k), where k is the number of factors of a system, so the test suite can be rapidly generated using the algorithm in large-scale software systems. The hierarchical property is beneficial to the successive fault diagnostic stage. A constructive upper bound can be obtained that grows as O(log k). The experimental results show that the algorithm is effective.

A new speedy generation algorithm for pairwise testing