Abstract:With the rapidly increasing test time of semiconductor testing, the trend is currently toward improving test parallelism by exploiting multi-site testing. However, excessive test I/O channels and test power consumption lead to the degradation of multi-site testing efficiency owing to the limited number of tester I/Os and power capacity. In this paper, we present an advanced low pin count test architecture for efficient multi-site testing in semiconductors. To achieve this, the scan chain routing method is first exploited to reduce the power consumption during scan-based testing through a cluster-based approach, which is compatible with the test compression architecture. Subsequently, a new test compression architecture is proposed to encode test patterns and enable the testing of each device-under-test (DUT) through a low input test pin count by using the unique properties of the proposed tri-state detector and boundary scan architecture. The experimental results show the decrease in the test I/O requirements and test power consumption. Based on these improvements, the test application time (TAT) was significantly reduced for ISCAS'89 and IWLS'05 OpenCores benchmark circuits compared to the previous methods, without a heavy burden on the additional H/W area and routing overhead.

Hierarchical High Speed Testing and Verification of Chip-Multiprocessors

Architecture Design of a Single-chip Multiprocessor

Acceleration Techniques for Chip-Multiprocessor Simulator Debug

Exploring Hardware Transaction Processing for Reliable Computing in Chip-Multiprocessors Against Soft Errors

The Stanford Hydra CMP

Load Balance Scheduling Algorithm for CMP Architecture

Test of the MPCore cache bandwidthand considerations for efficient software execution

Hardware Support for Message-Passing in Chip Multi-Processors.

A Redundancy Mechanism under Single Chip Multiprocessor Architecture

Process Variation Characterization Of Chip-Level Multiprocessors

Research on Parallel Reading and Drawing Techniques for Chemical Mechanical Polishing Simulation Data Based on Multi-Thread

In-Place Irregular Computation for Message-Passing Chip-Multiprocessors.

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

A Novel Memory Subsystem Evaluation Framework for Chip Multiprocessors.

An Extensible Memory Simulation Framework for Chip Multi-Processors

SPMTM: A Novel ScratchPad Memory Based Hybrid Nested Transactional Memory Framework

Concurrent Testing for Heterogeneous-Cores in Network-on-Chips

Dynamic Error Detection for Dependable Cache Coherency in Multicore Architectures

Test Program Generation for Microprocessor Verification Using Local Modeling Strategy

Fault-tolerant Design Techniques in A CMP Architecture

Random Test Program Generator for Microprocessor Verification