Abstract:We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as cross-layer resilience. In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments. Our framework automatically and systematically explores the large space of comprehensive resilience techniques and their combinations across various layers of the system stack (586 cross-layer combinations in this paper), derives cost-effective solutions that achieve resilience targets at minimal costs, and provides guidelines for the design of new resilience techniques. We demonstrate the practicality and effectiveness of our framework using two diverse designs: a simple, in-order processor core and a complex, out-of-order processor core. Our results demonstrate that a carefully optimized combination of circuit-level hardening, logic-level parity checking, and micro-architectural recovery provides a highly cost-effective soft error resilience solution for general-purpose processor cores. For example, a 50x improvement in silent data corruption rate is achieved at only 2.1% energy cost for an out-of-order core (6.1% for an in-order core) with no speed impact. However, selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience solution as well (with ~1% additional energy cost for a 50x improvement in silent data corruption rate).

Exploring Hardware Transaction Processing for Reliable Computing in Chip-Multiprocessors Against Soft Errors

Characterizing Soft Error Vulnerability of Cache Coherence Protocols for Chip-Multiprocessors

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

Characterizing the L1 Data Cache's Vulnerability to Transient Errors in Chip-Multiprocessors

Design of COTS-based Fault-Tolerant Multiprocessor Real-Time Operating System

Dynamic Error Detection for Dependable Cache Coherency in Multicore Architectures

A Fault-Tolerant Single-Chip Multiprocessor

Architecture Design of a Single-chip Multiprocessor

Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

An Energy-Efficient Microprocessor Using Multilevel Error Correction For Timing Error Tolerance

The Study of Transient Faults Propagation in Multithread Applications

Fault-tolerant Design Techniques in A CMP Architecture

Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience)

Hardening Architectures for Multiprocessor System-on-Chip

CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores

Resource-Driven Optimizations for Transient-Fault Detecting Superscalar Microarchitectures

Exploring the vulnerability of CMPs to soft errors with 3D stacked non-volatile memory

A Near Threshold Error Resilient Processor Based on Dynamic Timing Error Prediction and Within-a-cycle Timing Error Correction

Hierarchical High Speed Testing and Verification of Chip-Multiprocessors

A Variation-Tolerant Near-Threshold Processor with Instruction-Level Error Correction