Review of Defects Study of ZnO Films

Lin Yimei,Ye Zhizhen,LanLan Chen,Liping Zhu,Jingyun Huang
2006-01-01
Abstract:The latest progress in defects study of ZnO films,such as its growth techniques,its formation mechanisms,its influence on ZnO semi-conducting materials and on photo-electronic devices made of ZnO semi-conducting materials and on photo-electronic devices made of ZnO,etc,has been tentatively reviewed with discussion focused on technological applications.
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