Abstract:Dependence of the secondary electron yield (SEY) from the primary beam incident energy and the coverage has been measured for neon, argon, krypton and xenon condensed on a target at 4.2K. The beam energy ranged between 100 eV and 3 keV, the maximal applied coverage have made up 12000, 4700, 2500 and 1400 monolayers correspondingly for neon, argon, krypton and xenon. The SEY results for these coverages can be considered as belonging only to investigated gases without influence of the target material. The SEY dependencies versus the primary beam energy for all gases comprise only an ascending part and therefore, the maximal measured SEY values have been obtained for the beam energy of 3keV and have made up 62, 73, 60.5 and 52 for neon, argon, krypton and xenon correspondingly. Values of the first cross-over have made up 21 eV for neon, 14 eV for argon, 12.5 eV for krypton and 10.5 eV for xenon. An internal field appearing across a film due to the beam impact can considerably affect the SEY measurements that demanded the beam current to be reduced till 9.0E-10A. Duration of the beam impact varied between 500 \mu sec and 250 \mu sec. It was found that reliable SEY measurements can also be taken on a charged surface if the charge was acquired due to beam impact with electrons of higher energy. All SEY measurements for once applied coverage have been carried out for whole range of incident energies from 3 keV down to 100 eV without renewing the film. Developing of pores inside of a deposited film can significantly increase the SEY as it was observed during warming up the target.

Secondary Electron Emission from Carbon Foils by Ne2+ Near Bohr Velocity

Forward and Backward Secondary Electron Emission from Carbon Foils by O2+ Ion

Secondary Electron Emission from Carbon Foils under O2+ Ion Impact

Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils

Comparison of Carbon Thin Films with Low Secondary Electron Yield Deposited in Neon and Argon

Contribution from recoiling atoms in secondary electron emission induced by slow highly charged ions from tungsten surface

Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

A Field Emission Study of the Critical Parameters of Amorphous Carbon Films Deposited on a Variety of Carbonaceous Substrates

Measurements of the Secondary Electron Emission from Rare Gases at 4.2K

Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

Charge state distributions of Xenon ions with keV kinetic energies transmitted through graphene and carbon self-supporting foils

Charge effect in secondary electron emission from silicon surface induced by slow neon ions

Monte Carlo Simulation Of Positron Induced Secondary Electrons In Thin Carbon Foils

Field Emission Properties of Nanocomposite Carbon Nitride Films

Monte Carlo Study of Secondary Electron Emission

Field emission from a new form of thin film amorphous carbon having nanoparticle inclusions and carbon nanotubes

Effect of amorphous carbon film on secondary electron emission from metal

Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of Mev Si and Si-2 Clusters

Secondary Electron Emission from Surfaces with Small Structure

Electron Emission from Tungsten Surface Induced by Neon Ions

Field Electron Emission from Carbon Containing Thin Films