Failure Analysis of BGA Lead-free Solder Joints under Drop Impact

LIU Fang,MENG Guang,ZHAO Mei
DOI: https://doi.org/10.3321/j.issn:1006-2467.2009.05.009
2009-01-01
Abstract:Failure mechanism of ball grid array(BGA) lead-free solder joint under board-level drop impact was investigated.Drop tests of three different heights were conducted.The dye stain test and metallurgical analysis were carried out in order to study the failure mechanism of lead-free solder joint under drop impact.The results show that the fracture occurs in intermetallic compound(IMC) on the package side,and that failure mode is brittle fracture.Its failure is different from that of Sn-Pb solder joint.The root cause of the failure of BGA lead-free solder joint is mechanical shock and cyclic bending of PCB under consecutive drop impact.
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