Abstract:Transient faults due to neutron and alpha particle strikes posea significant obstacle to increasing processor transistor counts infuture technologies. Although fault rates of individual transistorsmay not rise significantly, incorporating more transistors into adevice makes that device more likely to encounter a fault. Hence,maintaining processor error rates at acceptable levels will requireincreasing design effort.This paper proposes two simple approaches to reduce errorrates and evaluates their application to a microprocessor instructionqueue. The first technique reduces the time instructions sit invulnerable storage structures by selectively squashing instructionswhen long delays are encountered. A fault is less likely to cause anerror if the structure it affects does not contain valid instructions.We introduce a new metric, MITF (Mean Instructions To Failure),to capture the trade-off between performance and reliability introducedby this approach.The second technique addresses false detected errors. In theabsence of a fault detection mechanism, such errors would nothave affected the final outcome of a program. For example, a faultaffecting the result of a dynamically dead instruction would notchange the final program output, but could still be flagged by thehardware as an error. To avoid signalling such false errors, wemodify a pipeline's error detection logic to mark affected instructionsand data as possibly incorrect rather than immediately signalingan error. Then, we signal an error only if we determine laterthat the possibly incorrect value could have affected the program'soutput.

A Low-Cost Correction Algorithm for Transient Data Errors

The Modified SICC Algorithm in Gross Error Detection

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

Statistical Analysis of Soft Error Rate in Digital Logic Design Including Process Variations

A Timing Failure Tolerance Design with In-Field Simultaneous Error Detection and Correction.

Characterizing the L1 Data Cache's Vulnerability to Transient Errors in Chip-Multiprocessors

Transient Fault Representativenesses Comparison Analysis

Application Specified Soft-Error Failure Rate Analysis Using Sequential Equivalence Checking Techniques

A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

An Energy-Efficient Microprocessor Using Multilevel Error Correction For Timing Error Tolerance

Research of an Error-tolerant Technique Based on Hybrid of Hardware and Software

A VDD Correction Method for Static Stability Test of SRAM Bit Cell

An improved method for test chip design

Error Cancellation Flip-Flop Design with Lightweight In-Situ Error Correction

Run‐time Error Detection of Space‐robot Based on Adaptive Redundancy

BEC: Bit-Level Static Analysis for Reliability against Soft Errors

Resource-Driven Optimizations for Transient-Fault Detecting Superscalar Microarchitectures

A Novel Soft Error Immunity SRAM Cell

A Near Threshold Error Resilient Processor Based on Dynamic Timing Error Prediction and Within-a-cycle Timing Error Correction

A new error masking flip-flop with one cycle correction penalty