Nondestructive measurement of terahertz optical thin films by machine learning based on physical consistency
ziwei ming,defeng liu,long xiao,le yang,Yuehuan Cheng,Haoming Yang,Jiahao Zhou,Hao Ding,Zhengang Yang,Kejia Wang,Ziwei Ming,Defeng Liu,Long Xiao,Le Yang
DOI: https://doi.org/10.1364/oe.521609
IF: 3.8
2024-04-19
Optics Express
Abstract:Ziwei Ming, Defeng Liu, Long Xiao, Le Yang, Yuehuan Cheng, Haoming Yang, Jiahao Zhou, Hao Ding, Zhengang Yang, Kejia Wang Optical scattering measurement is one of the most commonly used methods for non-contact online measurement of film properties in industrial ... [Opt. Express 32, 16426-16436 (2024)]
optics