High-throughput speckle spectrometers based on multifractal scattering media

bhupesh kumar,Yilin Zhu,Luca Dal Negro,Sebastian Schulz
DOI: https://doi.org/10.1364/ome.511275
2024-03-15
Optical Materials Express
Abstract:Bhupesh Kumar, Yilin Zhu, Luca Dal Negro, Sebastian A. Schulz We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator ... [Opt. Mater. Express 14, 944-954 (2024)]
materials science, multidisciplinary,optics
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