Ultra-high resolution and broadband chip-scale speckle enhanced Fourier-transform spectrometer

Uttam Paudel,Todd S. Rose

DOI: https://doi.org/10.1364/OE.388153

2020-04-30

Abstract:Recent advancements in silicon photonics are enabling the development of chip-scale photonics devices for sensing and signal processing applications, among which on-chip spectrometers are of particular interest for precision wavelength monitoring and related applications. Most chip-scale spectrometers suffer from a resolution-bandwidth trade-off, thus limiting the uses of the device. Here we report on a novel passive, chip-scale, hybrid speckle-enhanced Fourier transform device that exhibits a two order-of-magnitude improvement in finesse (bandwidth/resolution) over the state-of-the art chip-scale speckle and Fourier transform spectrometers. In our proof-of-principle device, we demonstrate a spectral resolution of 140 MHz with 12-nm bandwidth for a finesse of $10^4$ that can operate over a range of 1500-1600 nm. This chip-scale spectrometer structure implements a typical spatial heterodyne discrete Fourier transform interferometer network that is enhanced by speckle generated from the wafer substrate. This latter effect, which is extremely simple to invoke, superimposes the high wavelength resolution intrinsic to speckle generated from a strongly guiding waveguide with a more broadband but lower resolution discrete Fourier transform modality of the overarching waveguide structure. This hybrid approach signifies a new pathway for realizing chip-scale spectrometers capable of ultra-high resolution and broadband performance.

Applied Physics,Materials Science,Instrumentation and Detectors,Optics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to achieve a balance between ultra - high resolution and broadband - width performance in chip - level spectrometers. Most existing chip - level spectrometers are limited in their applications due to the resolution - bandwidth trade - off. Specifically, although traditional discrete Fourier transform (DFT) spectrometers and multi - mode waveguide (MMW) - based speckle spectrometers each have their own advantages, it is difficult for them to achieve both high resolution and broadband - width simultaneously. The paper introduces a new type of passive chip - level hybrid speckle - enhanced Fourier transform (SDFT) spectrometer. By combining DFT and speckle modes, it achieves a fineness (i.e., bandwidth / resolution) improvement of two orders of magnitude higher than existing technologies without increasing the number of structures or the device size. This new - type spectrometer can operate in the range of 1500 - 1600 nm with a spectral resolution of 140 MHz and a bandwidth of 12 nm, significantly improving the performance of chip - level spectrometers and opening up a new path for achieving chip - level spectrometers with super - resolution and broadband - width.