Electromigration behavior of Sn–3.0Ag–0.5Cu/Sn–37Pb hybrid solder joints with various mixed percentages for aerospace electronics

DOI: https://doi.org/10.1007/s10854-024-12609-1
2024-04-25
Journal of Materials Science Materials in Electronics
Abstract:The microstructural evolution and failure mode of Sn–3.0Ag–0.5Cu (SAC305)/Sn–37Pb hybrid ball grid array solder joints with various mixed percentages undergoing electromigration (EM) at 130 °C with a current density of 5 × 10 3 A/cm 2 were investigated. The EM reliability of Ni/SAC305/Sn–37Pb/Ni hybrid solder joints increased with increasing mixed percentage. The hybrid solder joints with 25% mixed percentage had the worst EM reliability, showing cracks and occurrence of final failure at the cathode, since higher Pb content at the cathode decreased the melting point of solder while increased the local resistivity of solder and subsequently more Joule heat was generated to melt the local solder, and finally the hybrid solder joints failed in the liquid–solid EM failure mode. While for the hybrid solder joints with higher mixed percentages (50 and 100%), only a few voids occurred at the cathode. The growth rate of interfacial IMCs at the anode was the fastest for the hybrid solder joints with 100% mixed percentage, due to the lower diffusion activation energy of atoms; while at the cathode, the thickness of interfacial IMCs increased first and then decreased, due to the combined effect of chemical potential gradient-induced flux and EM-induced flux.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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