Molecular Beam Epitaxy Of Highly Crystalline Monolayer Molybdenum Disulfide On Hexagonal Boron Nitride
Deyi Fu,Xiaoxu Zhao,Yu-Yang Zhang,Linjun Li,Hai Xu,A-Rang Jang,Seong In Yoon,Peng Song,Sock Mui Poh,Tianhua Ren,Zijing Ding,Wei Fu,Tae Joo Shin,Hyeon Suk Shin,Sokrates T. Pantelides,Wu Zhou,Kian Ping Loh
DOI: https://doi.org/10.1021/jacs.7b05131
IF: 15
2017-01-01
Journal of the American Chemical Society
Abstract:Atomically thin molybdenum disulfide (MoS2), a direct-band-gap semiconductor, is promising for applications in electronics and optoelectronics, but the scalable synthesis of highly crystalline film remains challenging. Here we report the successful epitaxial growth of a continuous, uniform, highly crystalline monolayer MoS2 film on hexagonal boron nitride (h-BN) by molecular beam epitaxy. Atomic force microscopy and electron microscopy studies reveal that MoS2 grown on h-BN primarily consists of two types of nucleation grains (0 aligned and 60 degrees antialigned domains). By adopting a high growth temperature and ultralow precursor flux, the formation of 60 degrees antialigned grains is largely suppressed. The resulting perfectly aligned grains merge seamlessly into a highly crystalline film. Large-scale monolayer MoS2 film can be grown on a 2 in. h-BN/sapphire wafer, for which surface morphology and Raman mapping confirm good spatial uniformity. Our study represents a significant step in the scalable synthesis of highly crystalline MoS2 films on atomically flat surfaces and paves the way to large-scale applications.