Characterization of Ceria Films in SBA-15

Ching-Yu Wang,Kai Shen,John M. Vohs,Raymond J. Gorte
DOI: https://doi.org/10.1021/acs.jpcc.3c08003
2024-02-28
The Journal of Physical Chemistry C
Abstract:Ceria films were deposited on SBA-15 by Atomic Layer Deposition (ALD) to loadings of 40-wt %, and the materials were then examined as possible supports for Pd in the CO oxidation and water–gas shift (WGS) reactions. N2 adsorption isotherms and transmission electron microscopy confirmed that CeO2 was uniformly deposited in the pores. X-ray Diffraction and X-ray Absorption Near Edge Structure (XANES) results suggested that the Ce was present as small, 2.4 nm CeO2 crystallites following oxidation at 1073 K, but heating in H2 at 1073 K resulted in the complete reduction of the Ce cations from +4 to +3. Raman spectra of the reduced samples suggested the formation of a cerium silicate. Coulometric titration measurements showed that equilibrium P­(O2) for ceria films on SBA-15 was shifted to values between 1012 and 1015 higher than those of ceria films on Al2O3 at 1073 K, implying ceria films in SBA-15 are much more easily reduced. However, the CO oxidation and WGS rates for Pd catalysts supported on CeO2/SBA-15 were lower than rates on CeO2/Al2O3, implying that higher reducibility may not always lead to higher reaction rates.
chemistry, physical,nanoscience & nanotechnology,materials science, multidisciplinary
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