Dual-wavelength Fourier ptychographic microscopy for topographic measurement

Qun Hao,Chao Lin,Yao Hu,Qian Yu,Jiahang Lv,Chuanjian Zheng,Shaohui Zhang,Chuheng Xu,Ci Song
DOI: https://doi.org/10.1364/oe.516874
IF: 3.8
2024-02-10
Optics Express
Abstract:Qun Hao, Chao Lin, Yao Hu, Qian Yu, Jiahang Lv, Chuanjian Zheng, Shaohui Zhang, Chuheng Xu, Ci Song Topographic measurements of micro- or nanostructures are essential in cutting-edge scientific disciplines such as optical communications, ... [Opt. Express 32, 6684-6699 (2024)]
optics
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