Enhanced denoising for weak signal preservation in structured illumination microscopy

Zhengan Fu,Junkang Dai,Bowen Liu,Zitong Jin,JinJin Zheng,Huaian Chen,Yi Jin
DOI: https://doi.org/10.1364/oe.536965
IF: 3.8
2024-09-05
Optics Express
Abstract:Zhengan Fu, Junkang Dai, Bowen Liu, Zitong Jin, JinJin Zheng, Huaian Chen, Yi Jin Structured illumination microscopy (SIM) is a powerful super-resolution technology in biological science because of its fast imaging speed, ... [Opt. Express 32, 33628-33640 (2024)]
optics
What problem does this paper attempt to address?