Development of a Portable and Low-Cost Data Acquisition System With Edge Intelligence for Electrical Impedance Tomography-Based Spatial Damage Detection

Damond M. Li,Long Wang
DOI: https://doi.org/10.1109/tim.2024.3470054
IF: 5.6
2024-10-19
IEEE Transactions on Instrumentation and Measurement
Abstract:The electrical impedance tomography (EIT) is a noninvasive imaging technique that can inspect the internal conductivity distribution of a material of interest. Currently, to perform continuous anomaly monitoring tasks, the EIT measurement data needs to be constantly streamed to an external device (e.g., a computer) for analysis. This can be highly energy-inefficient, especially for a deployable, battery-powered EIT data acquisition (DAQ) system. To transform the conventional workflow and advance the EIT technique, this study developed an edge intelligence functionality for a novel, portable, low-cost, and wireless EIT DAQ system, enabling the DAQ hardware to detect the existence of anomalies. This study also demonstrated that future research could focus on addressing hardware limitations to further improve EIT reconstruction resolution on edge devices. Overall, this study laid the foundation for advancing EIT DAQ systems to include edge intelligent functionality so that they can operate independently from any external devices for continuous monitoring applications.
engineering, electrical & electronic,instruments & instrumentation
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