Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence

Ivan Yu. Eremchev,Aleksandr O. Tarasevich,Maria A. Kniazeva,Jun Li,Andrei V. Naumov,Ivan G. Scheblykin
DOI: https://doi.org/10.1021/acs.nanolett.2c04004
IF: 10.8
2023-03-11
Nano Letters
Abstract:Time-resolved analysis of photon cross-correlation function g^((2))(τ) is applied to photoluminescence (PL) of individual submicrometer size MAPbI(3) perovskite crystals. Surprisingly, an antibunching effect in the long-living tail of PL is observed, while the prompt PL obeys the photon statistics typical for a classical emitter. We propose that antibunched photons from the PL decay tail originate from radiative recombination of detrapped charge carriers which were initially captured by a very...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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