Abstract:In recent years, a novel x-ray imaging modality has emerged that reveals unresolved sample microstructure via a "dark-field image", which provides complementary information to conventional "bright-field" images, such as attenuation and phase-contrast modalities. This x-ray dark-field signal is produced by unresolved microstructures scattering the x-ray beam resulting in localised image blur. Dark-field retrieval techniques extract this blur to reconstruct a dark-field image. Unfortunately, the presence of non-dark-field blur such as source-size blur or the detector point-spread-function can affect the dark-field retrieval as they also blur the experimental image. In addition, dark-field images can be degraded by the artefacts induced by large intensity gradients from attenuation and propagation-based phase contrast, particularly around sample edges. By measuring any non-dark-field blurring across the image plane and removing it from experimental images, as well as removing attenuation and propagation-based phase contrast, we show that a directional dark-field image can be retrieved with fewer artefacts and more consistent quantitative measures. We present the details of these corrections and provide "before and after" directional dark-field images of samples imaged at a synchrotron source. This paper utilises single-grid directional dark-field imaging, but these corrections have the potential to be broadly applied to other x-ray imaging techniques.

Laboratory-based x-ray dark-field microscopy

Sub-diffraction Dark Spot Localization Microscopy

Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy

Single-exposure X-ray dark-field imaging via a dual-energy propagation-based setup

X-ray Free Electron Laser based Dark-Field X-ray Microscopy

Digital Dark Field -- Higher Contrast and Greater Specificity Dark Field Imaging using a 4DSTEM Approach

Epi-illumination Dark-Field Microscopy Enables Direct Visualization of Unlabeled Small Organisms with High Spatial and Temporal Resolution.

Single-shot X-ray Dark-field Tomography

Dark-Field X-Ray Microscopy with Structured Illumination for Three-Dimensional Imaging

X-ray dark-field via spectral propagation-based imaging

High-Resolution Scanning X-ray Diffraction Microscopy

Direct x-ray scattering signal measurements in edge-illumination/beam-tracking imaging and their interplay with the variance of the refraction signals

Dark-field and directional dark-field on low coherence X-ray sources with random mask modulations: validation with SAXS anisotropy measurements

Resolution Improvement of Dark-Field Microscopy Via Microparticle Near-Field Illumination.

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Correcting directional dark-field x-ray imaging artefacts using position-dependent image deblurring and attenuation removal

Structured light dark-field microscope

Dark-field tomography of an attenuating object using intrinsic x-ray speckle tracking