Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy

Sami Wirtensohn,Peng Qi,Christan David,Julia Herzen,Imke Greving,Silja Flenner
DOI: https://doi.org/10.1364/OPTICA.524812
2024-05-03
Abstract:The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright-field by motorized apertures in the back focal plane of the objective's lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale.
Optics,Instrumentation and Detectors
What problem does this paper attempt to address?
The paper aims to address the implementation issues of dark-field imaging technology at the nanoscale and apply it to full-field transmission X-ray microscopy (TXM) to reveal the scattering structure of samples. Specifically, the objectives of the paper include: 1. **Extending Dark-Field Imaging Capabilities**: Currently, the application of dark-field technology is limited to the micron scale. The goal of this research is to extend this technology to the nanoscale to better observe sample features in fields such as materials science, biomedical research, and geology. 2. **Improving Existing Methods**: Existing dark-field imaging methods face challenges at the nanoscale, such as difficulties in grating fabrication and complex image processing. Therefore, this research proposes a new method to overcome these limitations. 3. **Achieving Rapid Mode Switching**: The new method allows for quick switching between transmission mode and dark-field mode, which helps improve data acquisition efficiency and reduce experimental time. 4. **Enhancing Contrast and Detection Capability**: By introducing dark-field signals, the detection capability of internal structures of samples (such as cracks, bubbles, or material boundaries) can be enhanced, which is crucial for understanding the intrinsic properties of materials. 5. **Simplifying the Implementation Process**: The method is based on simple optical components (such as motor-driven apertures), making it easy to implement and stable, thus enabling the widespread application of dark-field imaging technology at the nanoscale. In summary, this research aims to address the technical challenges of dark-field imaging at the nanoscale by proposing a new full-field transmission X-ray microscopy dark-field imaging technology, thereby providing more advanced imaging tools for fields such as materials science.