Monolayer Sm films on Ta and Cu substrates.

Tao,Goering,Horn,denBoer
DOI: https://doi.org/10.1103/PHYSREVB.48.15289
1993-11-15
Abstract:We have studied the electronic properties of ultrathin layers of Sm on Ta and Cu substrates using valence-band and resonant photoemission. The average formal chemical valence of Sm on Ta increases from below 2.4 at low coverage to the value measured from bulk Sm at higher coverage, while the valence of Sm on Cu is 3 at low coverage and decreases abruptly to the same value measured for Ta substrates at higher coverage. These changes in electronic properties reflect interlayer and intralayer interactions in these films, particularly the weak Sm-Ta and strong Sm-Cu interactions.
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