Repeated treatment with imipramine potentiates cocaine-induced dopamine release and motor stimulation.

Z. Rossetti,P. D’Aquila,Y. Hmaidan,G. Gessa,G. Serra

DOI: https://doi.org/10.1016/0014-2999(91)90353-R

IF: 5.195

1991-08-29

European Journal of Pharmacology

Abstract:

What problem does this paper attempt to address?

Molecular Dynamics Simulation of Form Measurement Process of Soft Materials Using Atomic Force Microscope

Yindi Cai,Yuan-Liu Chen,Yuki Shimizu,So Ito,Wei Gao

DOI: https://doi.org/10.1109/nems.2016.7758221

2016-01-01

Abstract:Molecular dynamics simulations of contact mode form measurement process on a soft substrate with a special surface profile using a diamond AFM tip are preformed to investigate the contact behavior and the surface profile damages or distortions of the measured substrate. The process of contact mode imaging of the AFM can be treated as the process of nano-scratching. The simulation-predicted interaction force, including scratching force and normal force, characterizes the saw-tooth pattern, which is referred to as atomic stick-slips. The shape of measured substrate surface, especially the surface underneath the AFM tip, is distorted by the interaction force between the AFM tip and the substrate surface.
Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

Joshua Giblin-Burnham,Yousef Javanmardi,Emad Moeendarbary,Bart Hoogenboom

DOI: https://doi.org/10.1039/d4sm01084a

IF: 4.046

2024-11-18

Soft Matter

Abstract:Atomic force microscopy (AFM) provides a three-dimensional topographic representation of a sample surface, at nanometre resolution. Computational simulations can aid the interpretation of such representations, but have mostly been limited to cases where both the AFM probe and the sample are hard and not compressible. In many applications, however, the sample is soft and therefore deformed due to the force exerted by the AFM tip. Here we use finite element modelling (FEM) to study how the measured AFM topography relates to the surface structures of soft and compressible materials. Consistent with previous analytical studies, the measured elastic modulus in AFM is generally found to deviate from the elastic modulus of the sample material. By the analysis of simple surface geometries, the FEM modelling shows how measured mechanical and topographic features in AFM images depend on a combination of tip-sample geometry and indentation of the tip into the sample. Importantly for the interpretation of AFM data, nanoparticles may appear larger or smaller by a factor of two depending on tip size and indentation force; and a higher spatial resolution in AFM images does not necessarily coincide with a more accurate representation of the sample surface. These observations on simple surface geometries also extend to molecular-resolution AFM, as illustrated by comparing FEM results with experimental data acquired on DNA. Taken together, the FEM results provide a framework that aids the interpretation of surface topography and local mechanics as measured by AFM.

polymer science,chemistry, physical,materials science, multidisciplinary,physics
A near real-time framework for extracting tip-sample forces in dynamic atomic force microscopy (dAFM)

David Busch,Qingze Zou,Baskar Ganapathysubramanian

DOI: https://doi.org/10.48550/arXiv.1109.0334

2011-09-02

Materials Science

Abstract:The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen causes cantilever deflections that are measured by an optical sensing mechanism and subsequently utilized to construct the sample topography. Recent years have seen increased interest in using the AFM to characterize soft specimens like gels and live cells. This remains challenging due to the complex and competing nature of tip-sample interaction forces - large tip-sample interaction force is necessary to achieve good signal-to-noise ratios; However, large force tends to deform and destroy soft samples. In situ estimation of the local tip-sample interaction force is needed to control the AFM cantilever motion and prevent destruction of soft samples while maintaining a good signal-to-noise ratio. This necessitates the ability to rapidly estimate the tip-sample forces from the cantilever deflection during operation. This paper proposes a first approach to a near real-time framework for tip-sample force inversion. We pose the inverse problem of extracting the tip-sample force as an unconstrained optimization problem. A fast, parallel forward solver is developed by utilizing graphical processing units (GPU). This forward solver shows an effective 30000 fold speed-up over a comparable CPU implementation, resulting in milli-second calculation times. The forward solver is coupled with a GPU based particle-swarm optimization implementation. We illustrate the framework on three classes of tip-sample interaction inversions. Each of these inversions is performed in sub-second timings, showing potential for integration with on-line AFM imaging and material characterization
Advances in dynamic AFM: from nanoscale energy dissipation to material properties in the nanoscale

Sergio Santos,Karim Gadelrab,Chia-Yun Lai,Tuza Olukan,Josep Font,Victor Barcons,Albert Verdaguer,Matteo Chiesa

DOI: https://doi.org/10.1063/5.0041366

2020-11-19

Abstract:Since the inception of the atomic force microscope AFM, dynamic methods have been very fruitful by establishing methods to quantify dissipative and conservative forces in the nanoscale and by providing a means to apply gentle forces to the samples with high resolution. Here we review developments that cover over a decade of our work on energy dissipation, phase contrast and the extraction of relevant material properties from observables. We describe the attempts to recover material properties via one dimensional amplitude and phase curves from force models and explore the evolution of these methods in terms of force reconstruction, fits of experimental measurements, and the more recent advances in multifrequency AFM.

Mesoscale and Nanoscale Physics,Materials Science
Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Andreas Mark,Nicolas Helfricht,Astrid Rauh,Jinqiao Xue,Patrick Knoedler,Thorsten Schumacher,Matthias Karg,Binyang Du,Markus Lippitz,Georg Papastavrou

DOI: https://doi.org/10.1038/s41598-019-56716-0

IF: 4.6

2019-01-01

Scientific Reports

Abstract:The combination of atomic force microscopy (AFM) with nanofluidics, also referred to as FluidFM, has facilitated new applications in scanning ion conductance microscopy, direct force measurements, lithography, or controlled nanoparticle deposition. An essential element of this new type of AFMs is its cantilever, which bears an internal micro-channel with a defined aperture at the end. Here, we present a new approach for in-situ characterization of the internal micro-channels, which is non-destructive and based on electrochemical methods. It allows for probing the internal environment of a micro-channeled cantilever and the corresponding aperture, respectively. Acquiring the streaming current in the microchannel allows to determine not only the state of the aperture over a wide range of ionic strengths but also the surface chemistry of the cantilever's internal channel. The high practical applicability of this method is demonstrated by detecting the aspiration of polymeric, inorganic and hydrogel particles with diameters ranging from several mu m down to 300 nm. By verifying in-situ the state of the aperture, i.e. open versus closed, electrophysiological or nano-deposition experiments will be significantly facilitated. Moreover, our approach is of high significance for direct force measurements by the FluidFM-technique and sub-micron colloidal probes.
Atomic Force Microscopy Simulations for CO-functionalized tips with Deep Learning

Jaime Carracedo-Cosme,Rubén Pérez

DOI: https://doi.org/10.48550/arXiv.2212.13809

2022-12-28

Abstract:Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is often difficult, making the support of theoretical simulations important. Current simulation methods, particularly the most accurate ones, require expertise and resources to perform ab initio calculations for the necessary inputs (i.e charge density and electrostatic potential of the molecule). Here, we propose an efficient and simple alternative to simulate these AFM images based on a Conditional Generative Adversarial Network (CGAN), that avoids all force calculations, and uses as the only input a 2D ball--and--stick depiction of the molecule. We discuss the performance of the model when optimized using different training subsets. Our CGAN reproduces accurately the intramolecular contrast observed in the simulated images for quasi--planar molecules, but has significant limitations for molecules with a significant internal torsion, due to the strictly 2D character of the input.

Materials Science,Disordered Systems and Neural Networks
Interaction imaging with amplitude-dependence force spectroscopy

Daniel Platz,Daniel Forchheimer,Erik A. Tholen,David B. Haviland

DOI: https://doi.org/10.1038/ncomms2365

2013-02-06

Abstract:Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic AFM has been enormously successful in imaging surface topography, even to atomic resolution, but the force between the AFM tip and the surface remains unknown during imaging. Here, we present a new approach that combines high accuracy force measurements and high resolution scanning. The method, called amplitude-dependence force spectroscopy (ADFS) is based on the amplitude-dependence of the cantilever's response near resonance and allows for separate determination of both conservative and dissipative tip-surface interactions. We use ADFS to quantitatively study and map the nano-mechanical interaction between the AFM tip and heterogeneous polymer surfaces. ADFS is compatible with commercial atomic force microscopes and we anticipate its wide-spread use in taking AFM toward quantitative microscopy.

Mesoscale and Nanoscale Physics
AFMfit : Deciphering conformational dynamics in AFM data using fast nonlinear NMA and FFT-based search

Remi Vuillemot,Jean-Luc Pellequer,Sergei Grudinin

DOI: https://doi.org/10.1101/2024.06.03.597083

2024-06-03

Abstract:Atomic Force Microscopy (AFM) offers a unique opportunity to study the conformational dynamics of proteins in near-physiological conditions at the single-molecule level. However, interpreting the two-dimensional molecular surfaces of multiple molecules measured in AFM experiments as three-dimensional conformational dynamics of a single molecule poses a significant challenge. Here, we present AFMfit, a flexible fitting procedure that deforms an input atomic model to match multiple AFM observations. The fitted models form a conformational ensemble that unambiguously describes the AFM experiment. Our method uses a new fast fitting algorithm based on the nonlinear Normal Mode Analysis (NMA) method NOLB to associate each molecule with its conformational state. AFMfit processes conformations of hundreds of AFM images of a single molecule in a few minutes on a single workstation, enabling analysis of larger datasets, including high-speed (HS)-AFM. We demonstrate the applications of our methods to synthetic and experimental AFM/HS-AFM data that include activated factor V and a membrane-embedded transient receptor potential channel TRPV3. AFMfit is an open-source Python package available at https://gricad-gitlab.univ-grenoble-alpes.fr/GruLab/AFMfit.

Bioinformatics
Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

Santiago D Solares

DOI: https://doi.org/10.3762/bjnano.7.49

IF: 3.1

2016-04-15

Beilstein Journal of Nanotechnology

Abstract:Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip–sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young’s modulus. Relevant cases are discussed for single- and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip–sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. A multifrequency AFM simulation tool based on the above sample model is provided as supporting information.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
viAFM - a Python toolset for virtual Atomic Force Microscopy

Katarzyna Walczewska-Szewc,Beata Niklas,Wieslaw Nowak

DOI: https://doi.org/10.26434/chemrxiv-2024-0h32j

2024-09-10

Abstract:Atomic Force Microscopy (AFM) is a powerful but demanding imaging technique used also to study the interaction strength of single biomolecules by force spectroscopy. Here we provide a viAFM program designed to facilitate multi- directional steered molecular dynamics simulations and analysis of forces required to disrupt protein complexes thus mimicking AFM force spectroscopy experiments. Our viAFM tool allows for rapid assessment of protein-protein interaction strength, anisotropy, and the impact of ligands or mutations on complex stability, enabling efficient testing of drug candidates.

Chemistry
Measurement of the complete interaction force curve at the nanoscale

Mario S. Rodrigues,Luca Costa,Joel Chevrier,Fabio Comin

DOI: https://doi.org/10.1063/1.4766172

2012-06-01

Abstract:The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits when it is to probe attractive interactions with high sensitivity. The Force Feedback Microscope (FFM) described here, removes from AFM the well known jump to contact problem that precludes the complete exploration of the interaction curve and the study of associated energy exchanges. The FFM makes it possible to explore tip-surface interactions in the entire range of distances with a sensitivity better than 1 pN. FFM stands out as a radical change in AFM control paradigms. With a surprisingly simple arrangement it is possible to provide the AFM tip with the right counterforce to keep it fixed at any time. The counterforce is consequently equal to the tip-sample force. The force, force gradient and damping are simultaneously measured independently of the tip position. This permits the measurement of energy transfer in thermodynamic transformations. Here we show some FFM measurement examples of the complete interaction force curve and in particular that the FFM can follow the nucleation of a water bridge by measuring the capillary attractive force at all distances, without jump to contact despite the large attractive capillary force. Real time combination of the measured parameters will lead to new imaging modalities with chemical contrast in different environments.

Mesoscale and Nanoscale Physics,Instrumentation and Detectors
Nanoscale mechanical manipulation of ultrathin SiN membranes enabling infrared near-field microscopy of liquid-immersed samples

Enrico Baù,Thorsten Gölz,Martin Benoit,Andreas Tittl,Fritz Keilmann

2024-04-02

Abstract:Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently been extended towards label-free nanoscopy of the dynamics of living cells and nanoparticles, assessing both the optical and the mechanical interactions between the tip, the membrane and the liquid suspension underneath. Here, we report that the tapping AFM tip induces a reversible nanometric deformation of the membrane manifested as either an indentation or protrusion. This mechanism depends on the driving force of the tapping cantilever, which we exploit to minimize topographical deformations of the membrane to improve optical measurements. Furthermore, we show that the tapping phase, or phase delay between driving signal and tip oscillation, is a highly sensitive observable for quantifying the mechanics of adhering objects, exhibiting highest contrast for low tapping amplitudes where the membrane remains nearly flat. We correlate mechanical responses with simultaneously recorded spectroscopy data to reveal the thickness of nanometric water pockets between membrane and adhering objects. Besides a general applicability of depth profiling, our technique holds great promise for studying mechano-active biopolymers and living cells, biomaterials that exhibit complex behaviors when under a mechanical load.

Optics
A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

Anis Nassim Ahmine,Myriam Bdiri,Sophie Féréol,Redouane Fodil

DOI: https://doi.org/10.1038/s41598-024-75958-1

IF: 4.6

2024-10-30

Scientific Reports

Abstract:Atomic Force Microscopy (AFM) is a leading nanoscale technique known for its significant advantages in the analysis of soft materials and biological samples. Traditional AFM data analysis is often based on the Hertz model, which assumes perpendicular indentation of a planar sample. However, this assumption is not always valid due to the varying geometries of soft materials, whether natural, synthetic or biological. In this study, we present a new theoretical model that incorporates correction coefficients into Hertz's model to account for cone-like and spherical probes, and to consider local tilt at the probe-sample interface. We validate our model using finite element analysis (FEA) simulations and experimental AFM measurements on tilted polyacrylamide gels. Our results highlight the need to include local tilt at the probe-sample contact to ensure accurate AFM measurements. This represents a step forward in our understanding of the elastic properties at the surface of soft materials in the broadest sense.

multidisciplinary sciences
Probabilistic Estimation of Mechanical Properties of Biomaterials Using Atomic Force Microscopy

Lei Cong,D. Foran,L. Goodell,J. Desai,Wenjin Chen,R. Roy

DOI: https://doi.org/10.1109/TBME.2013.2283597

IF: 4.6

2014-02-01

IEEE Transactions on Biomedical Engineering

Abstract:Nanoindentation using contact-mode atomic force microscopy (AFM) has emerged as a powerful tool for effective material characterization of a wide variety of biomaterials across multiple length scales. However, the interpretation of force-indentation experimental data from AFM is subject to some debate. Uncertainties in AFM data analysis stems from two primary sources: The exact point of contact between the AFM probe and the biological specimen and the variability in the spring constant of the AFM probe. While a lot of attention has been directed toward addressing the contact-point uncertainty, the effect of variability in the probe spring constant has not received sufficient attention. In this paper, we report on an error-in-variables-based Bayesian change-point approach to quantify the elastic modulus of human breast tissue samples after accounting for variability in both contact point and the probe spring constant. We also discuss the efficacy of our approach to a wide range of hyperparameter values using a sensitivity analysis.

Computer Science,Engineering,Medicine,Materials Science
Quantitative dynamic force microscopy with inclined tip oscillation

Philipp Rahe,Daniel Heile,Reinhard Olbrich,Michael Reichling

DOI: https://doi.org/10.3762/bjnano.13.53

2022-07-06

Abstract:In the mathematical description of dynamic atomic force microscopy (AFM), the relation between the tip-surface normal interaction force, the measurement observables, and the probe excitation parameters is defined by an average of the normal force along the sampling path over the oscillation cycle. Usually, it is tacitly assumed that tip oscillation and force data recording follows the same path perpendicular to the surface. Experimentally, however, the sampling path representing the tip oscillating trajectory is often inclined with respect to the surface normal and the data recording path. Here, we extend the mathematical description of dynamic AFM to include the case of an inclined sampling path. We find that the inclination of the tip movement can have critical consequences for data interpretation, especially for measurements on nanostructured surfaces exhibiting significant lateral force components. Inclination effects are illustrated by simulation results that resemble the representative experimental conditions of measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction.
Simulation atomic force microscopy for atomic reconstruction of biomolecular structures from resolution-limited experimental images

Romain Amyot,Arin Marchesi,Clemens M. Franz,Ignacio Casuso,Holger Flechsig

DOI: https://doi.org/10.1371/journal.pcbi.1009970

2022-03-16

PLoS Computational Biology

Abstract:Atomic force microscopy (AFM) can visualize the dynamics of single biomolecules under near-physiological conditions. However, the scanning tip probes only the molecular surface with limited resolution, missing details required to fully deduce functional mechanisms from imaging alone. To overcome such drawbacks, we developed a computational framework to reconstruct 3D atomistic structures from AFM surface scans, employing simulation AFM and automatized fitting to experimental images. We provide applications to AFM images ranging from single molecular machines, protein filaments, to large-scale assemblies of 2D protein lattices, and demonstrate how the obtained full atomistic information advances the molecular understanding beyond the original topographic AFM image. We show that simulation AFM further allows for quantitative molecular feature assignment within measured AFM topographies. Implementation of the developed methods into the versatile interactive interface of the BioAFMviewer software, freely available at www.bioafmviewer.com , presents the opportunity for the broad Bio-AFM community to employ the enormous amount of existing structural and modeling data to facilitate the interpretation of resolution-limited AFM images.

biochemical research methods,mathematical & computational biology
AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy Created With Digital Twin Technology

Eyan Forsythe,Fangzhou Xia,Shane Lovett,Malek Ibrahim,K. Youcef-Toumi

DOI: https://doi.org/10.1109/TMECH.2023.3274695

2023-08-01

IEEE/ASME Transactions on Mechatronics

Abstract:The Atomic Force Microscope (AFM) is a precision mechatronic system for nanoscale imaging of surfaces. Due to limited instrument access and lack of visualization techniques, understanding its principles can be challenging. Digital twin technology allows the creation of virtual representations of physical systems, which can be particularly useful to address challenges in AFM education. To realistically simulate nanoscale physics, we first developed new efficient algorithms for four virtual scale models, including cantilever mechanics, probe transducers, controller tuning, and contact mechanics. Second, three simulated experiment interactive learning modules are developed for instrument operation, including virtual imaging, system overview, and imaging modalities. In the end, three hardware systems are integrated for an extended reality experience, including a macroscopic AFM scale model, a haptic device for probe-sample interaction force feedback, and an upgraded low-cost educational AFM for nanoscale imaging and instrumentation. This completes the eight total modules for the AFM SMILER: A scale model interactive learning extended reality toolkit. Preliminary studies show the toolkit being helpful for AFM education. In addition to mechatronics and nanotechnology education, techniques developed in this work can be generally applied to computationally efficient realistic digital twin creation.

Computer Science,Physics,Materials Science,Education,Engineering
Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip

Alemdar Hasanov,Alexandre Kawano,Onur Baysal

DOI: https://doi.org/10.3934/mine.2024006

2024-01-01

Mathematics in Engineering

Abstract:We present a new comprehensive mathematical model of the cone-shaped cantilever tip-sample interaction in Atomic Force Microscopy (AFM). The importance of such AFMs with cone-shaped cantilevers can be appreciated when its ability to provide high-resolution information at the nanoscale is recalled. It is an indispensable tool in a wide range of scientific and industrial fields. The interaction of the cone-shaped cantilever tip with the surface of the specimen (sample) is modeled by the damped Euler-Bernoulli beam equation $ \rho_A(x)u_{tt} $ $ +\mu(x)u_{t}+(r(x)u_{xx}+\kappa(x)u_{xxt})_{xx} = 0 $, $ (x, t)\in (0, \ell)\times (0, T) $, subject to the following initial, $ u(x, 0) = 0 $, $ u_t(x, 0) = 0 $ and boundary, $ u(0, t) = 0 $, $ u_{x}(0, t) = 0 $, $ \left (r(x)u_{xx}(x, t)+\kappa(x)u_{xxt} \right)_{x = \ell} = M(t) $, $ \left (-(r(x)u_{xx}+\kappa(x)u_{xxt})_x\right)_{x = \ell} = g(t) $ conditions, where $ M(t): = 2h\cos \theta\, g(t)/\pi $ is the moment generated by the transverse shear force $ g(t) $. Based on this model, we propose an inversion algorithm for the reconstruction of an unknown shear force in the AFM cantilever. The measured displacement $ \nu(t): = u(\ell, t) $ is used as additional data for the reconstruction of the shear force $ g(t) $. The least square functional $ J(F) = \frac{1}{2}\Vert u(\ell, \cdot)-\nu \Vert_{L^2(0, T)}^2 $ is introduced and an explicit gradient formula for the Fréchet derivative of the cost functional is derived via the weak solution of the adjoint problem. Additionally, the geometric parameters of the cone-shaped tip are explicitly contained in this formula. This enables us to construct a gradient based numerical algorithm for the reconstructions of the shear force from noise free as well as from random noisy measured output $ \nu (t) $. Computational experiments show that the proposed algorithm is very fast and robust. This creates the basis for developing a numerical "gadget" for computational experiments with generic AFMs.

mathematics, interdisciplinary applications
Nanoscale Mechanical Manipulation of Ultrathin SiN Membranes Enabling Infrared Near‐Field Microscopy of Liquid‐Immersed samples

Enrico Baù,Thorsten Gölz,Martin Benoit,Andreas Tittl,Fritz Keilmann

DOI: https://doi.org/10.1002/smll.202402568

IF: 13.3

2024-08-18

Small

Abstract:The mechanical and optical interactions between a tapping AFM tip and thin SiN membranes with adhering objects in aqueous environment are studied. Mechanical responses are correlated with simultaneously recorded spectroscopy data to reveal the thickness of nanometric water layers between membrane and sample, a technique which holds great promise for future studies on complex biomaterials such as living cells. Scattering scanning near‐field optical microscopy (s‐SNOM) is a powerful technique for mid‐infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s‐SNOM has recently been extended toward label‐free nanoscopy of the dynamics of living cells and nanoparticles, assessing both the optical and the mechanical interactions between the tip, the membrane and the liquid suspension underneath. Here, the study reports that the tapping AFM tip induces a reversible nanometric deformation of the membrane manifested as either an indentation or protrusion. This mechanism depends on the driving force of the tapping cantilever, which is exploited to minimize topographical deformations of the membrane to improve optical measurements. Furthermore, it is shown that the tapping phase delay between driving signal and tip oscillation is a highly sensitive observable to study the mechanics of adhering objects, exhibiting highest contrast at low tapping amplitudes where the membrane remains nearly flat. Mechanical responses are correlated with simultaneously recorded spectroscopy data to reveal the thickness of nanometric water layers between membrane and adhering objects. Besides a general applicability of depth profiling, the technique holds great promise for studying mechano‐active biopolymers and living cells, biomaterials that exhibit complex behaviors when under a mechanical load.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification

Zehra Parlak,F. Levent Degertekin

DOI: https://doi.org/10.1063/1.2936881

IF: 2.877

2008-06-01

Journal of Applied Physics

Abstract:We describe a three-dimensional (3D) finite element analysis model of the contact between an atomic force microscopy (AFM) tip and a substrate with finite size subsurface structures. The model can simulate the contact stiffness measured by a scanning AFM tip on the surface of a sample with buried nanoscale structures. In addition to the analytical verification and convergence analysis, we present the results of an experimental verification study. For this purpose, we use an atomic force acoustic microscopy setup and special silicon samples with well defined subsurface cavities fabricated by focused ion beam techniques. The 3D model is also used for parametric analysis of subsurface defect detection, and imaging simulations are performed for practical applications such as AFM imaging of electromigration defects.

physics, applied

Repeated treatment with imipramine potentiates cocaine-induced dopamine release and motor stimulation.

Molecular Dynamics Simulation of Form Measurement Process of Soft Materials Using Atomic Force Microscope

Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

A near real-time framework for extracting tip-sample forces in dynamic atomic force microscopy (dAFM)

Advances in dynamic AFM: from nanoscale energy dissipation to material properties in the nanoscale

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Atomic Force Microscopy Simulations for CO-functionalized tips with Deep Learning

Interaction imaging with amplitude-dependence force spectroscopy

AFMfit : Deciphering conformational dynamics in AFM data using fast nonlinear NMA and FFT-based search

Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

viAFM - a Python toolset for virtual Atomic Force Microscopy

Measurement of the complete interaction force curve at the nanoscale

Nanoscale mechanical manipulation of ultrathin SiN membranes enabling infrared near-field microscopy of liquid-immersed samples

A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

Probabilistic Estimation of Mechanical Properties of Biomaterials Using Atomic Force Microscopy

Quantitative dynamic force microscopy with inclined tip oscillation

Simulation atomic force microscopy for atomic reconstruction of biomolecular structures from resolution-limited experimental images

AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy Created With Digital Twin Technology

Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip

Nanoscale Mechanical Manipulation of Ultrathin SiN Membranes Enabling Infrared Near‐Field Microscopy of Liquid‐Immersed samples

Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification