Abstract:AbstractIntegrated photonic‐assisted instantaneous frequency measurements (IFMs) have been extensively explored and widely used in 5G/6G communications, navigation, automotive control, and radar systems. They offer significant advantages such as wide frequency, low power consumption, and immunity to electromagnetic interference compared to electrical solutions. As data traffic in high‐speed wireless communication systems and the operation bandwidth of advanced radar systems continue to grow, there is an urgent need for large instantaneous bandwidths and accurate frequency measurements to ensure signal integrity and efficient bandwidth utilization. However, achieving wide‐bandwidth and high‐precision measurements simultaneously with photonic IFMs remains challenging. Here, an integrated photonic IFM system based on a thin‐film lithium niobate (TFLN) platform is demonstrated that can dynamically identify signals with wide‐band frequency changes. The system incorporates a wide‐bandwidth Mach–Zehnder modulator (MZM) and a high‐Q Mach–Zehnder interferometer (MZI)‐coupled microring resonator (MRR) for double‐sideband suppressed‐carrier (DSB‐SC) modulation. Additionally, it includes dual‐stage frequency discriminator based on asymmetric MZIs (AMZIs) for both coarse wide‐band and accurate narrow‐band measurements. The proposed IFM system operates over a wide‐band frequency up to 67 GHz with a low root mean square (RMS) error of less than 123 MHz. This work opens up a path for high‐performance broadband microwave photonic applications using TFLN platform.

Absolute Measurement of Dynamic Low-Finesse Fabry–Perot Cavity Using Phase-Shifting White-Light Interferometry

Thin‐Film‐Lithium‐Niobate Photonic Chip for Ultra‐Wideband and High‐Precision Microwave Frequency Measurement

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Absolute Distance Measurement with Spectral Domain White-Light Interferometer

Measurement of the Group Refractive Index of Bulk Material Using White-Light Spectral Interferometry

Low Noisy Dual Wavelength Digital Holography and Application in the Ultra-precision Machining Surface Measurement

Simultaneous Measurement of Vibration and Temperature Using Frequency-Scanned Parallel Phase-Shifting Interferometry

Signal Processing of White-Light Interferometric Low-Finesse Fiber-Optic Fabry-Perot Sensors

Absolute Single Cavity Length Interrogation of Fiber-Optic Compound Fabry⁻Perot Pressure Sensors Through a White Light Non-Scanning Correlation Method

Note: an in Situ Method for Measuring the Non-Linear Response of a Fabry-Perot Cavity.

Fast interrogation of dynamic low‐finesse Fabry‐Perot interferometers: A review

Instantaneous Microwave Frequency Measurement with a Uniform Resolution and Improved Dynamic Range

Subnanometer Absolute Displacement Measurement Using a Frequency Comb Referenced Dual Resonance Tracking Fabry-Perot Interferometer.

Squeezing-Enhanced Fiber Mach-Zehnder Interferometer for Low-Frequency Phase Measurement

In-fiber chirped Fabry–Perot cavity for temperature sensing

Modeling of Low-Finesse, Extrinsic Fiber Optic Fabry-Perot White Light Interferometers

Extensible multi-wavelength interrogation method for arbitrary cavities in low-fineness multi-cavity Fabry-Pérot interferometric sensors

Measurement of ultra—low losses in optical supercavity with CW laser source

Diaphragm Based Long Cavity Fabry–Perot Fiber Acoustic Sensor Using Phase Generated Carrier

Method on Double-Pass Acousto-Optic Frequency Shifter in Absolute Distance Measurement Using Fabry-Pérot Interferometry

Effective transmittance of Fabry–Perot cavity under non-parallel beam incidence