Pressure-induced evolution of structure and electronic property of GeP
Yajun Tao,Shiyu Xie,Tenglong Lu,Chuansheng Hu,Hengjie Liu,Huanjun Zhang,Xuerui Cheng,Miao Liu,Zeming Qi
DOI: https://doi.org/10.1063/5.0086327
IF: 2.877
2022-01-01
Journal of Applied Physics
Abstract:The monoclinic semiconductor GeP is a new class of Group IV-V layered material, and it shows attractive anisotropic optical and electronic properties. In this paper, we investigate the structural and electronic evolution of layered GeP under pressure, using in situ x-ray diffraction, Raman and infrared spectra, and the density functional theory. All characterization methods reveal that the pressure causes two obvious phase changes. One isostructural transition is observed around 6 GPa. Above 21 GPa, another crystalline-to-amorphous transformation is obtained. It is worth noting that the high-pressure amorphous state can be retained at ambient conditions after the pressure is released. In addition, the pressure-induced red-shift of absorbance edge suggests its bandgap decreases with pressure. This result indicates that pressure has a significant effect on GeP. Meanwhile, it also provides a method for obtaining amorphous GeP, which is of interest to the energy storage community as it is a potential anode material for lithium-ion batteries.& nbsp;Published under an exclusive license by AIP Publishing.