Infants' use of featural information in the segregation of stationary objects

A. Needham

DOI: https://doi.org/10.1016/S0163-6383(98)90054-6

Abstract:

What problem does this paper attempt to address?

Nanoscale rheology: Dynamic Mechanical Analysis over a broad and continuous frequency range using Photothermal Actuation Atomic Force Microscopy

Alba R. Piacenti,Casey Adam,Nicholas Hawkins,Ryan Wagner,Jacob Seifert,Yukinori Taniguchi,Roger Proksch,Sonia Contera

2023-08-01

Abstract:Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their constitutive polymer molecules. Polymeric materials behave viscoelastically, i.e. their mechanical responses depend on the time scale of the measurements; quantifying these time-dependent rheological properties at the nanoscale is relevant to develop, for example, accurate models and simulations of those materials, which are needed for advanced industrial applications. In this paper, an atomic force microscopy (AFM) method based on the photothermal actuation of an AFM cantilever is developed to quantify the nanoscale loss tangent, storage modulus, and loss modulus of polymeric materials. The method is then validated on a styrene-butadiene rubber (SBR), demonstrating the method's ability to quantify nanoscale viscoelasticity over a continuous frequency range up to five orders of magnitude (0.2 Hz to 20,200 Hz). Furthermore, this method is combined with AFM viscoelastic mapping obtained with amplitude-modulation frequency-modulation (AM-FM) AFM, enabling the extension of viscoelastic quantification over an even broader frequency range, and demonstrating that the novel technique synergizes with preexisting AFM techniques for quantitative measurement of viscoelastic properties. The method presented here introduces a way to characterize the viscoelasticity of polymeric materials, and soft matter in general at the nanoscale, for any application.

Mesoscale and Nanoscale Physics
Enhancing Nanoscale Viscoelasticity Characterization in Bimodal Atomic Force Microscopy

Casey Adam,Alba Rosa Piacenti,Sarah L Waters,Sonia Contera

DOI: https://doi.org/10.1039/d4sm00671b

IF: 4.046

2024-09-04

Soft Matter

Abstract:Polymeric, soft, and biological materials exhibit viscoelasticity, which is a time dependent mechanical response to deformation. Material viscoelasticity emerges from the movement of a material's constituent molecules at the nano- and microscale in response to applied deformation, and viscoelastic properties therefore depend on the speed at which a material is deformed. Recent technological advances, especially in atomic force microscopy (AFM), have provided tools to measure and map material viscoelasticity with nanoscale resolution. However, to understand more about the viscoelastic behavior of a material from such measurements, theoretical grounding during data analysis is required. For example, commercially available bimodal AFM imaging maps two different viscoelastic properties of a sample, the storage modulus, E′, and loss tangent, tanδ, with each property being measured by a different resonance frequency of the AFM cantilever. While such techniques provide high resolution maps of E′ and tanδ, the different measurement frequencies make it difficult to calculate key viscoelastic properties of the sample such as: the model of viscoelasticity that describes the sample, the loss modulus, E′′, at either frequency, elasticity E, viscosity η, and characteristic response times τ. To overcome this difficulty, we present a new data analysis procedure derived from linear viscoelasticity theory. This method is applied and validated by performing amplitude modulation-frequency modulation (AM-FM) AFM, a commercially available bimodal imaging technique, on a styrene-butadiene rubber (SBR) with known mechanical behavior. The new analysis procedure correctly identified the type of viscoelasticity exhibited by the SBR and accurately calculated SBR E, η, and τ, providing a useful means of enhancing the amount of information gained about a sample's nanoscale viscoelastic properties from bimodal AFM measurements. Additionally, being derived from fundamental models of linear viscoelasticity, the method can be employed for any technique where different viscoelastic properties are measured at different and discrete frequencies with applied deformations in the linear viscoelastic regime of a sample.

polymer science,chemistry, physical,materials science, multidisciplinary,physics
Direct Measurement of Storage and Loss Behavior in AFM Force-Distance Experiments Using the Modified Fourier Transformation

Berkin Uluutku,Marshall Richards McCraw,Santiago D. Solares

DOI: https://doi.org/10.1063/5.0088523

2022-02-18

Abstract:Force-distance curve experiments are commonly performed in Atomic Force Microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these characteristics consist of fitting a viscoelastic material model to the experimentally obtained AFM data. Here, we demonstrate a new method that utilizes the modified discrete Fourier transform to approximate the storage and loss behavior of a material directly from the data, without the need for a fit. Additionally, one may still fit a model to the resulting storage and loss behavior if a parameterized description of the material is desired. In contrast to fitting the data to a model chosen a priori, departing from a model-free description of the material's frequency behavior guides the selection of the model, such that the user may choose the one that is most appropriate for the particular material under study. To this end, we also include modified Fourier domain descriptions of commonly used viscoelastic models.

Applied Physics
Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

Santiago D Solares

DOI: https://doi.org/10.3762/bjnano.7.49

IF: 3.1

2016-04-15

Beilstein Journal of Nanotechnology

Abstract:Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip–sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young’s modulus. Relevant cases are discussed for single- and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip–sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. A multifrequency AFM simulation tool based on the above sample model is provided as supporting information.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

Anis Nassim Ahmine,Myriam Bdiri,Sophie Féréol,Redouane Fodil

DOI: https://doi.org/10.1038/s41598-024-75958-1

IF: 4.6

2024-10-30

Scientific Reports

Abstract:Atomic Force Microscopy (AFM) is a leading nanoscale technique known for its significant advantages in the analysis of soft materials and biological samples. Traditional AFM data analysis is often based on the Hertz model, which assumes perpendicular indentation of a planar sample. However, this assumption is not always valid due to the varying geometries of soft materials, whether natural, synthetic or biological. In this study, we present a new theoretical model that incorporates correction coefficients into Hertz's model to account for cone-like and spherical probes, and to consider local tilt at the probe-sample interface. We validate our model using finite element analysis (FEA) simulations and experimental AFM measurements on tilted polyacrylamide gels. Our results highlight the need to include local tilt at the probe-sample contact to ensure accurate AFM measurements. This represents a step forward in our understanding of the elastic properties at the surface of soft materials in the broadest sense.

multidisciplinary sciences
Nanoscale DMA with the Atomic Force Microscope: A New Method for Measuring Viscoelastic Properties of Nanostructured Polymer Materials

Bede Pittenger,Sergey Osechinskiy,Dalia Yablon,Thomas Mueller

DOI: https://doi.org/10.1007/s11837-019-03698-z

2019-07-31

JOM

Abstract:We introduce nanoscale dynamic mechanical analysis (DMA) based on atomic force microscopy (AFM), a new mode for quantitative viscoelastic analysis of heterogeneous polymer materials at the nanoscale (AFM-nDMA). AFM-nDMA takes advantage of the exquisite force sensitivity, small contact radius, and nanoscale indentation depth of the AFM to provide dynamic mechanical analysis with 10 nm spatial resolution at rheologically relevant frequencies and variable temperature. This novel, non-resonant measurement is embedded in a force curve and typically occurs at a series of frequencies to provide spectra of storage modulus, loss modulus, and loss tangent. By using tailored probes and mitigating the effect of contact radius changes throughout the measurement, quantitative results are obtained that tie directly to bulk DMA and allow for time–temperature superposition analysis. The combination of quantitative results and 10 nm spatial resolution holds promise for the investigation of previously inaccessible microscopic domains, confinement effects, and interphases.

materials science, multidisciplinary,metallurgy & metallurgical engineering,mining & mineral processing,mineralogy
A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

Berkin Uluutku,Enrique A López-Guerra,Santiago D Solares

DOI: https://doi.org/10.3762/bjnano.12.79

IF: 3.1

2021-09-23

Beilstein Journal of Nanotechnology

Abstract:Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed with the aid of force–distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the observed material behavior to specific viscoelastic models, such as generalized viscoelastic models or power-law rheology models, among others. Here we propose a new method to invert and obtain the viscoelastic properties of a material through the use of the Z-transform, without using a model. We present the rheological viscoelastic relations in their classical derivation and their z -domain correspondence. We illustrate the proposed technique on a model experiment involving a traditional ramp-shaped force–distance AFM curve, demonstrating good agreement between the viscoelastic characteristics extracted from the simulated experiment and the theoretical expectations. We also provide a path for calculating standard viscoelastic responses from the extracted material characteristics. The new technique based on the Z-transform is complementary to previous model-based viscoelastic analyses and can be advantageous with respect to Fourier techniques due to its generality. Additionally, it can handle the unbounded inputs traditionally used to acquire force–distance relationships in AFM, such as ramp functions, in which the cantilever position is displaced linearly with time for a finite period of time.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
Probabilistic Estimation of Mechanical Properties of Biomaterials Using Atomic Force Microscopy

Lei Cong,D. Foran,L. Goodell,J. Desai,Wenjin Chen,R. Roy

DOI: https://doi.org/10.1109/TBME.2013.2283597

IF: 4.6

2014-02-01

IEEE Transactions on Biomedical Engineering

Abstract:Nanoindentation using contact-mode atomic force microscopy (AFM) has emerged as a powerful tool for effective material characterization of a wide variety of biomaterials across multiple length scales. However, the interpretation of force-indentation experimental data from AFM is subject to some debate. Uncertainties in AFM data analysis stems from two primary sources: The exact point of contact between the AFM probe and the biological specimen and the variability in the spring constant of the AFM probe. While a lot of attention has been directed toward addressing the contact-point uncertainty, the effect of variability in the probe spring constant has not received sufficient attention. In this paper, we report on an error-in-variables-based Bayesian change-point approach to quantify the elastic modulus of human breast tissue samples after accounting for variability in both contact point and the probe spring constant. We also discuss the efficacy of our approach to a wide range of hyperparameter values using a sensitivity analysis.

Computer Science,Engineering,Medicine,Materials Science
An updated model including the deflection history of microcantilever for characterizing cellular viscoelastic properties by AFM indentation-relaxation test

Jiawei Ling,Nenghui Zhang,Yixing Shang,Hanlin Liu,Zhengnan Yin

DOI: https://doi.org/10.1007/s00707-024-04057-z

IF: 2.645

2024-08-19

Acta Mechanica

Abstract:Factors such as the memory effect of viscoelastic materials and the influence of microcantilever deflection still pose challenges in the mechanical modeling, mathematical solution, and material parameter identification for AFM indentation-relaxation experiments to characterize the viscoelastic properties of cells. This paper aims to provide a rational mechanical model for interpreting the detection signals in AFM indentation-relaxation experiments. Considering the contribution of microcantilever deflection under the Euler beam assumption to the viscoelastic indentation force, the Lee-Radok's model was updated. Combining a piecewise integration method and a time-domain differential method, we derived the implicit/explicit governing equations of the probe-cell viscoelastic indentation forces under ramp-hold protocol. After building the finite element (FE) model, we examined the effect of microcantilever deflection on the acquired data in FE simulation results and the updated model predictions, and compared our updated model with relevant experiments. Then, we proposed a new two-stage (TS) approach for parameter extraction and compared the differences between this new approach and the classic single-stage (SS) approach, thus the strategy for suppressing parameter extraction error was presented. The results validate that the transient modulus extracting by the classical SS approach is essentially an equivalent transient modulus dependent on the ramp loading history, which incurs a divergence in identification of cellular viscoelastic parameter; whereas the new TS approach is valid at a broader range of loading conditions due to explicitly reflecting the dependence of viscoelastic material parameters on ramp loading history. These conclusions provide a theoretical foundation and reference for the advancement of AFM-based detection techniques for cellular mechanical properties.

mechanics
Pushing AFM to the boundaries — interphase mechanical property measurements near a rigid body

Io Saito,Richard. J. Sheridan,Stefan Zauscher,L. Catherine Brinson

DOI: https://doi.org/10.26434/chemrxiv-2024-k21j4

2024-08-21

Abstract:Understanding the mechanical properties of polymer nanocomposite materials is essential for industrial use. Particularly, the determination of the polymer modulus at the nanofiller-polymer interphase is important for optimizing the interfacial mechanical properties. Nanoindentation via Atomic Force Microscopy (AFM) is well established for measuring the modulus of the interphase region with nanoscale spatial resolution. However, indentation into heterogeneous materials presents a confounding issue often referred to as the "substrate effect", i.e., the structural stress field caused by the rigid body is convoluted with the actual modulus of the interphase region. While finite element analysis (FEA)-based methods can be used to deconvolute the interphase modulus from measured apparent modulus-distance profiles, the experimental validation of this method is still needed. Here, we provide this validation using AFM nanoindentation on a layered model composite which consists of three layers with different moduli to recapitulate the properties of the matrix, the filler, and the interphase of real polymer nanocomposites. By systematically varying the thickness of the “artificial” interphase layer and the AFM probe radius, we obtain modulus - distance profiles over a wide range of indentation conditions. We validate a method to deconvolute the substrate effect using an empirically derived master curve obtained from FEA analysis. Furthermore, we showed that the effect of the artificial interphase on modulus - distance profiles can be distinguished only if the interphase layer is thick enough compared to the contact radius of the probe. Finally, we established an innovative and quantitative framework to predict the interphase thickness from mechanical nanoindentation measurements, and we discussed the lower, practical limit for interphase thickness determination. In summary, we provide a broadly applicable method to extract interphase mechanical properties of multiphase soft materials, and practical guidelines for choosing optimal characterization conditions.

Chemistry
On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy

Per-Anders Thorén,Riccardo Borgani,Daniel Forchheimer,Illia Dobryden,Per M. Claesson,Hailu G. Kassa,Philippe Leclère,Yifan Wang,Heinrich M. Jaeger,David B. Haviland

DOI: https://doi.org/10.1103/PhysRevApplied.10.024017

2018-05-21

Abstract:The interaction between a rapidly oscillating atomic force microscope tip and a soft material surface is described using both elastic and viscous forces with a moving surface model. We derive the simplest form of this model, motivating it as a way to capture the impact dynamics of the tip and sample with an interaction consisting of two components: interfacial or surface force, and bulk or volumetric force. Analytic solutions to the piece-wise linear model identify characteristic time constants, providing a physical explanation of the hysteresis observed in the measured dynamic force quadrature curves. Numerical simulation is used to fit the model to experimental data and excellent agreement is found with a variety of different samples. The model parameters form a dimensionless impact-rheology factor, giving a quantitative physical number to characterize a viscoelastic surface that does not depend on the tip shape or cantilever frequency.

Applied Physics,Soft Condensed Matter
A novel approach for extracting viscoelastic parameters of living cells through combination of inverse finite element simulation and Atomic Force Microscopy

Fanan Wei,Haitao Yang,Lianqing Liu,Guangyong Li

DOI: https://doi.org/10.1080/10255842.2016.1233403

2016-09-14

Abstract:Dynamic mechanical behaviour of living cells has been described by viscoelasticity. However, quantitation of the viscoelastic parameters for living cells is far from sophisticated. In this paper, combining inverse finite element (FE) simulation with Atomic Force Microscope characterization, we attempt to develop a new method to evaluate and acquire trustworthy viscoelastic index of living cells. First, influence of the experiment parameters on stress relaxation process is assessed using FE simulation. As suggested by the simulations, cell height has negligible impact on shape of the force-time curve, i.e. the characteristic relaxation time; and the effect originates from substrate can be totally eliminated when stiff substrate (Young's modulus larger than 3 GPa) is used. Then, so as to develop an effective optimization strategy for the inverse FE simulation, the parameters sensitivity evaluation is performed for Young's modulus, Poisson's ratio, and characteristic relaxation time. With the experiment data obtained through typical stress relaxation measurement, viscoelastic parameters are extracted through the inverse FE simulation by comparing the simulation results and experimental measurements. Finally, reliability of the acquired mechanical parameters is verified with different load experiments performed on the same cell.

engineering, biomedical,computer science, interdisciplinary applications
Multiparametric characterization of heterogeneous soft materials using contact point detection-based atomic force microscopy

Chih-Wen Yang,Ching-Hsiu Chen,Ren-Feng Ding,Hsien-Shun Liao,Ing-Shouh Hwang

DOI: https://doi.org/10.1016/j.apsusc.2020.146423

IF: 6.7

2020-08-01

Applied Surface Science

Abstract:<p>Force-distance (FD) curve-based atomic force microscopy (AFM) has been widely applied for characterizing the surface morphology and mechanical properties of soft materials at nanometer resolution. In this paper, we demonstrate FD curve-based AFM using a newly developed algorithm to detect contact points (CPs) from each FD curve and to determine properties such as stiffness, adhesion, and deformation. The performance of our method is compared with that of the tapping and peak force tapping (PFT) modes by imaging the same area of a heterogeneous blend of soft and hard polymers by using the same tip. The morphology obtained with our CP detection-based method is comparable to that obtained using the tapping mode, but PFT shows strong deviation in height images obtained on soft polymer regions. We also acquire FD curves at a much higher sampling rate than PFT. A site-dependent decaying oscillation following snap-in is detected, and the frequency of the decaying oscillation appears to be related to the stiffness of the region, pointing to a new direction for characterizing viscoelastic properties of sample surfaces with a high spatial resolution.</p>

chemistry, physical,physics, applied, condensed matter,materials science, coatings & films
Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

Joshua Giblin-Burnham,Yousef Javanmardi,Emad Moeendarbary,Bart Hoogenboom

DOI: https://doi.org/10.1039/d4sm01084a

IF: 4.046

2024-11-18

Soft Matter

Abstract:Atomic force microscopy (AFM) provides a three-dimensional topographic representation of a sample surface, at nanometre resolution. Computational simulations can aid the interpretation of such representations, but have mostly been limited to cases where both the AFM probe and the sample are hard and not compressible. In many applications, however, the sample is soft and therefore deformed due to the force exerted by the AFM tip. Here we use finite element modelling (FEM) to study how the measured AFM topography relates to the surface structures of soft and compressible materials. Consistent with previous analytical studies, the measured elastic modulus in AFM is generally found to deviate from the elastic modulus of the sample material. By the analysis of simple surface geometries, the FEM modelling shows how measured mechanical and topographic features in AFM images depend on a combination of tip-sample geometry and indentation of the tip into the sample. Importantly for the interpretation of AFM data, nanoparticles may appear larger or smaller by a factor of two depending on tip size and indentation force; and a higher spatial resolution in AFM images does not necessarily coincide with a more accurate representation of the sample surface. These observations on simple surface geometries also extend to molecular-resolution AFM, as illustrated by comparing FEM results with experimental data acquired on DNA. Taken together, the FEM results provide a framework that aids the interpretation of surface topography and local mechanics as measured by AFM.

polymer science,chemistry, physical,materials science, multidisciplinary,physics
Optomechanical micro-rheology of complex fluids at ultra-high frequency

H. Neshasteh,I. Shlesinger,M. Ravaro,M. Gély,G. Jourdan,S. Hentz,I. Favero

2024-10-17

Abstract:We present an optomechanical method for locally measuring the rheological properties of complex fluids in the ultra-high frequency range (UHF). A mechanical disk of microscale volume is used as a small-amplitude oscillating probe that monitors the fluid at rest in thermal equilibrium, while the oscillation is detected by optomechanical transduction within a sub-millisecond measurement time, thanks to an optimized signal collection. An original analytical model for fluid-structure interactions is used to extract from these measurements the rheological properties of liquids over the frequency range 100 MHz - 1 GHz. This new micro-rheology method is calibrated by measurements on liquid water, in which we observe pronounced compressibility effects above 500 MHz, but which we show remains Newtonian all over the explored range. In contrast, measurements reveal that liquid 1-decanol exhibits a non-Newtonian behavior, with a frequency-dependent viscosity associated to several relaxation frequencies in the UHF. Our data agree well with an extended Maxwell model for the viscosity of this alcohol, involving two relaxation times of 797 and 151 picoseconds, which are respectively analyzed as supramolecular and intramolecular relaxation processes. A shear elastic response of the liquid appears at the highest frequencies, compatible with the entropic elasticity of molecules as they attempt to uncurl, and whose value enables estimating the volume of a single molecule of liquid. UHF optomechanical micro-rheology demonstrates here a direct mechanical access to the fast molecular dynamics at play in a liquid, in a quantitative manner and in a short time.

Soft Condensed Matter,Optics
Advances in dynamic AFM: from nanoscale energy dissipation to material properties in the nanoscale

Sergio Santos,Karim Gadelrab,Chia-Yun Lai,Tuza Olukan,Josep Font,Victor Barcons,Albert Verdaguer,Matteo Chiesa

DOI: https://doi.org/10.1063/5.0041366

2020-11-19

Abstract:Since the inception of the atomic force microscope AFM, dynamic methods have been very fruitful by establishing methods to quantify dissipative and conservative forces in the nanoscale and by providing a means to apply gentle forces to the samples with high resolution. Here we review developments that cover over a decade of our work on energy dissipation, phase contrast and the extraction of relevant material properties from observables. We describe the attempts to recover material properties via one dimensional amplitude and phase curves from force models and explore the evolution of these methods in terms of force reconstruction, fits of experimental measurements, and the more recent advances in multifrequency AFM.

Mesoscale and Nanoscale Physics,Materials Science
A Novel Topography and Elasticity Synchronous Measure Approach With an AFM

Chao Wang,Yinan Wu,Yongchun Fang

DOI: https://doi.org/10.1109/tim.2020.2992876

IF: 5.6

2020-10-01

IEEE Transactions on Instrumentation and Measurement

Abstract:Atomic force microscopy (AFM) is a powerful tool to measure the topography or the mechanical properties of samples at the nanoscale. Currently, the method of force–distance curve analysis is usually adopted to obtain the mechanical properties by an AFM, which presents the drawbacks of long time consuming and impossibility to measure the topography and the mechanical properties simultaneously. To address these problems, this article proposes a novel topography/elasticity measurement approach, which efficiently obtains the topography and the mechanical properties of detected samples with a conventional AFM. To be specific, the set points for forward and backward scanning are carefully selected to be different, so as to yield different sample deformations and piezoactuator displacement, for the same point with forward and backward scanning. On this basis, a mathematical model is set up to simultaneously calculate the topography and Young’s modulus of the sample surface by carefully analyzing the obtained data from the scanning processes. In addition, considering the effect of $z$ -axis drift during the measurement process, an information fusion algorithm based on the least-squares method and the Kalman filter is proposed to successfully compensate for the drift and thus further improve the imaging quality. Experimental results are included to demonstrate the good performance of the proposed approach for topography and mechanical properties’ measurement.

engineering, electrical & electronic,instruments & instrumentation
Viscoelasticity of diverse biological samples quantified by Acoustic Force Microrheology (AFMR)

Giulia Bergamaschi,Kees-Karel H. Taris,Andreas S. Biebricher,Xamanie M. R. Seymonson,Hannes Witt,Erwin J. G. Peterman,Gijs J. L. Wuite

DOI: https://doi.org/10.1038/s42003-024-06367-3

IF: 6.548

2024-06-05

Communications Biology

Abstract:In the context of soft matter and cellular mechanics, microrheology - the use of micron-sized particles to probe the frequency-dependent viscoelastic response of materials – is widely used to shed light onto the mechanics and dynamics of molecular structures. Here we present the implementation of active microrheology in an Acoustic Force Spectroscopy setup (AFMR), which combines multiplexing with the possibility of probing a wide range of forces ( ~ pN to ~nN) and frequencies (0.01–100 Hz). To demonstrate the potential of this approach, we perform active microrheology on biological samples of increasing complexity and stiffness: collagen gels, red blood cells (RBCs), and human fibroblasts, spanning a viscoelastic modulus range of five orders of magnitude. We show that AFMR can successfully quantify viscoelastic properties by probing many beads with high single-particle precision and reproducibility. Finally, we demonstrate that AFMR to map local sample heterogeneities as well as detect cellular responses to drugs.

biology
Using the Adhesive Interaction Between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples

Yujie Sun,Boris B. Akhremitchev,Gilbert C. Walker

DOI: https://doi.org/10.1021/la036461q

IF: 3.9

2004-01-01

Langmuir

Abstract:An atomic force microscope (AFM) method for measuring surface elasticity based on the adhesive interactions between an AFM tip and sample surfaces is introduced. The method is particularly useful when there is a large adhesion between the tip and soft samples, when the indentation method would be less accurate. For thin and soft samples, this method will have much less interference from the substrate than is found using the indentation method because there is only passive indentation induced by tip-sample adhesion; in contrast, a large indentation with a sharp tip in the sample may break its stress-strain linearity, or even make it fracture. For the case where it is difficult to accurately locate the tip-sample contact point, which is problematic for the indentation method, the method based on adhesive interactions is helpful because it does not require locating the tip-sample contact point when fitting the whole retraction force curve. The model is tested on PDMS polymers with different degrees of cross-linking.
Validity of point-mass model in off-resonance dynamic atomic force microscopy

Shatruhan Singh Rajput,Surya Pratap S Deopa,V. J.Ajith,Sukrut C. Kamerkar,Shivprasad Patil

DOI: https://doi.org/10.48550/arXiv.2106.13631

2021-06-25

Abstract:The quantitative measurement of viscoelasticity of nano-scaleentities is an important goal of nanotechnology research and there is considerable progress with advent of dynamic Atomic Force Microscopy. The hydrodynamics of cantilever, the force sensor in AFM measurements, plays a pivotal role in quantitative estimates of nano-scale viscoelasticity. The point-mass model,wherein the AFM cantilever is approximated as a point mass with mass-less spring is widely used in dynamic AFM analysis and its validity, particularly in liquid environments, is debated. It is suggested that the cantilever must be treated as a continuous rectangular beam to obtain accurate estimates of nano-scale viscoelasticity of materials it is probing. Here, we derived equations, which relate stiffness and damping coefficient of the material under investigation to measured parameters, by approximating cantilever as a point mass and also considering the full geometric details. These equations are derived for both tip-excited as well as base excited cantilevers. We have performed off-resonance dynamic atomic force spectroscopy on a single protein molecule to investigate the validity of widely used point-mass model. We performed measurements with AFMs equipped with different cantilever excitation methods as well as detection schemes to measure cantilever response. The data was analyzed using both, continuous-beam model and the point-mass model. We found that both models yield same results when the experiments are performed in truly off-resonance regime with small amplitudes and the cantilever stiffness is much higher than the interaction stiffness. Our findings suggest that a simple point-mass approximation based model is adequate to describe the dynamics, provided care is taken while performing experiments so that the approximations used in these models are valid.

Soft Condensed Matter,Biological Physics

Infants' use of featural information in the segregation of stationary objects

Nanoscale rheology: Dynamic Mechanical Analysis over a broad and continuous frequency range using Photothermal Actuation Atomic Force Microscopy

Enhancing Nanoscale Viscoelasticity Characterization in Bimodal Atomic Force Microscopy

Direct Measurement of Storage and Loss Behavior in AFM Force-Distance Experiments Using the Modified Fourier Transformation

Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

Nanoscale DMA with the Atomic Force Microscope: A New Method for Measuring Viscoelastic Properties of Nanostructured Polymer Materials

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

Probabilistic Estimation of Mechanical Properties of Biomaterials Using Atomic Force Microscopy

An updated model including the deflection history of microcantilever for characterizing cellular viscoelastic properties by AFM indentation-relaxation test

Pushing AFM to the boundaries — interphase mechanical property measurements near a rigid body

On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy

A novel approach for extracting viscoelastic parameters of living cells through combination of inverse finite element simulation and Atomic Force Microscopy

Multiparametric characterization of heterogeneous soft materials using contact point detection-based atomic force microscopy

Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

Optomechanical micro-rheology of complex fluids at ultra-high frequency

Advances in dynamic AFM: from nanoscale energy dissipation to material properties in the nanoscale

A Novel Topography and Elasticity Synchronous Measure Approach With an AFM

Viscoelasticity of diverse biological samples quantified by Acoustic Force Microrheology (AFMR)

Using the Adhesive Interaction Between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples

Validity of point-mass model in off-resonance dynamic atomic force microscopy