Impact of temperature sensitivity on dead channel junctionless FET for linearity and high frequency applications

Shalini Chaudhary,Basudha Dewan,Devenderpal Singh,Menkaa Yadav
DOI: https://doi.org/10.1088/1361-6641/ad8fc7
IF: 2.048
2024-11-09
Semiconductor Science and Technology
Abstract:The operational framework of upcoming electronic devices is under examination to identify substitutes for MOSFETs, aiming to decrease power densities and alleviate constraints on energy efficiency. In this context, we present and examine an innovative structural design approach for double gate Junctionless Field-Effect Transistors (DG-JLFETs). This approach provides benefits in terms of fabrication, performance, and design considerations. The dead channel double gate junctionless FET (DC-DGJLFET) is the name given to this proposed structure. The term "dead channel" refers to the device's midchannel lack of conducting charge carriers caused by the P type layer and lowers functional channel thickness ( t Si ) and enhances the device's FOMs. Here, the performance indicators of DC-DGJLFET is also analysed for a temperature range of (200K - 450K) to calculate the RF (Radio frequency) and and linearity performances. Moreover, the suggested device exhibits superior linearity, particularly at elevated temperatures.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter
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