Abstract:High-resolution electron backscattering diffraction (HR-EBSD) was used to measure rotations and elastic strains by matching diffraction patterns based on cross-correlation. However, the subset-based phase correlation algorithm was unable to determine pattern shifts accurately when large rotations occurred. In this paper, a new matching algorithm was proposed to measure pattern shifts and recover the elastic strain and lattice rotation with finite deformation theory. The algorithm was implemented in two steps: (a) Integral pixel matching: The pixel-related information of the Kikuchi patterns was mapped to the original three-dimensional sphere to obtain the image projected in parallel by using the feature points as the pattern center through the transformation of its spatial coordinates. The correlation between the images projected in parallel before and after deformation was then obtained. The locations of the integral pixels were determined by the peaks of the surface of correlation obtained by traversing all pixels in the search area. (b) subpixel refinement: the locations of subpixels were obtained by FAGN with an appropriate shape function involving rotation and translation. The algorithm was applied to dynamic simulated test sets, and its results were compared with those of the first-pass cross-correlation and the second-pass cross-correlation method with remapping. The proposed method was more robust in the case of rotation and solved the problem that displacement vectors could not be accurately measured when a larger lattice rotation occurred. The mean errors of the measured displacement, rotation, and strain components were 0.02 pixel, 0.5×10-4rad, and 1×10-4, respectively. Compared with the second-pass cross-correlation method, the angle of rotation was more precisely extracted.

Local Kikuchi band detection in electron backscatter diffraction patterns for enhanced pattern indexing

A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Indexation of electron diffraction patterns at grain boundaries

Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach

Measurement of the pattern shifts for HR-EBSD with larger lattice rotations

EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation

Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

Compressive Electron Backscatter Diffraction Imaging

Employing constrained non-negative matrix factorization for microstructure segmentation

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Employing Constrained Nonnegative Matrix Factorization for Microstructure Segmentation

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Accuracy assessment of crystal orientation indexations by EBSD

Identification of Kikuchi lines in electron diffraction patterns collected in small-angle geometry

An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)

Anomaly Detection-Oriented Band Selection For Hyperspectral Image

Identifying rotational symmetry axes in Kikuchi patterns by reciprocal vectors

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors