Abstract:This article suggests a new waveguide design that utilizes a "walled" architecture. Instead of relying on conventional gap waveguide structures to create electronic bandgaps and prevent field leakage, the proposed design introduces a "walled" guiding mechanism. This technique preserves transmission while maintaining the multilayer approach and eliminates the need for nails or chemical bonds to attach the layers. Simulations were carried out in the W-band (75–110 GHz) and D-band (110–170 GHz) using several metals, and measurements were performed in the W-band using aluminum. The simulation results show that the reflection coefficient was less than −40 dB over the entire D-band. At the same time, the average insertion loss was around 0.0054 dB/mm and around 0.0065 dB/mm for silver and gold, respectively. Similarly, the reflection coefficient was less than −45 dB over the 75–110 GHz range, with an average insertion loss of 0.0018 dB/mm for silver and 0.003 dB/mm for gold, respectively. The aluminum model's reflection coefficient was less than −35 dB, and the average insertion loss was 0.0035 dB/mm. The experimental results achieved a reflection coefficient of less than –30 dB and the average transmission coefficient was −0.2 dB, with an insertion loss of 0.002 dB/mm. The simple stacking ability of the weightless walled metal plates and easy fabrication makes the proposed transmission line a promising technology in mmWave and Terahertz applications.

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