Numerical simulation of atomic layer deposition for thin deposit formation in a mesoporous substrate

Liwei Zhuang,Peter Corkery,Dennis T. Lee,Seungjoon Lee,Mahdi Kooshkbaghi,Zhen‐liang Xu,Gance Dai,Ioannis G. Kevrekidis,Michael Tsapatsis
DOI: https://doi.org/10.1002/aic.17305
IF: 4.167
2021-05-18
AIChE Journal
Abstract:<p>ZnO deposition in porous γ‐Al<sub>2</sub>O<sub>3</sub> via atomic layer deposition (ALD) is the critical first step for the fabrication of zeolitic imidazolate framework membranes using the LIPS (Ligand Induced Perm‐Selectivation) process. (Science, 361 (2018) 1008‐1011). A detailed Computational Fluid Dynamics (CFD) model of the ALD reactor was developed using a finite‐volume based code and validated. It accounts for the transport processes within the feeding system and reaction chamber. The simulated precursor spatiotemporal profiles assuming no ALD reaction were used as boundary conditions in modelling diethylzinc reaction/diffusion in porous γ‐Al<sub>2</sub>O<sub>3</sub>, the predictions of which agreed with experimental electron microscopy measurements. Further simulations confirmed that the present deposition flux is much less than the upper limit of flux, below which the decoupling of reactor/substrate is an accurate assumption. The modeling approach demonstrated here allows for the design of ALD processes for thin film membrane formation including the synthesis of metal‐organic framework membranes.</p><p>This article is protected by copyright. All rights reserved.</p>
engineering, chemical
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