Realizing reliable linearity and Forming-free in conductive bridging random access memory synapse by alloy electrode engineering

Ao Chen,Puyi Zhang,Yiwei Zheng,Xiaoxu Yuan,Guokun Ma,Yiheng Rao,Houzhao Wan,Nengfan Liu,Qin Chen,Daohong Yang,Hao Wang
DOI: https://doi.org/10.35848/1882-0786/ad2f65
IF: 2.819
2024-03-04
Applied Physics Express
Abstract:In this work, by Alloy electrode engineering, the Ti-Ag device performed the Forming-free property because Ag ions were promoted to migrate into the GeTeOx layer to form a thicker conductive filament. This facilitated a uniform change in conductance with the pulse number, and the alloy synapse achieved a significant improvement in linearity (350%), which demonstrated its enhancement in recognition accuracy. To further validate its potential as a comprehensive artificial synapse, the multi-essential synaptic behaviors, including spike-timing-dependent plasticity, spike-rate-dependent plasticity, paired-pulse facilitation, post-tetanic potentiation, and excitatory postsynaptic current, were achieved successfully.
physics, applied
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