MS-3-O-3410 Toward 3D mapping of the oxygen octahedral rotations in perovskite thin films unit cell by unit cell
R LupiniA.,Q Liang,D BiegalskiM.,A Borisevich
2014-01-01
Abstract:Email of the presenting author: heq1@ornl.gov Oxygen octahedral rotations (OOR) in perovskites couple strongly to properties, providing opportunities for creating novel functional materials.[1] Epitaxial thin films is a natural playground for controlling OOR since the film can be tuned through the elastic, electrical, and chemical interactions with the substrate. It is therefore critical to characterize OOR in thin films. Conventional methods either lack of spatial resolution (e.g. X-ray and Neutron diffraction[2]), unable to provide full 3D information (e.g. direct oxygen column imaging in electron microscopes[3-5]), or are not suitable for unit-cell-resolved measurements (e.g. electron diffraction[6-7]). The recently introduced position averaged converged beam electron diffraction (PACBED)[8] can in principle provide full tilt information and approach unit cell resolution. It, however, requires extensive simulations, which become especially prohibitive for complex systems with several competing phenomena, since each sample parameter such as thickness, polarization, strain, and tilt, adds an extra dimension to the simulation phase space. In this work, we propose a simpler strategy for characterizing OOR using direct oxygen imaging in STEM, using CaTiO3 as an example. Instead of looking along the in-phase rotating axis [100]pc, we obtain ABF STEM images from the [110]pc zone, along which O atoms in one unit cell form more than one column. Because of that, the shapes of those O columns within one unit cell and their symmetry relations to adjacent unit cells contain information about the OOR system. The phase of the OOR tilts in all three directions can be determined unit cell by unit cell using this approach (Fig.1). Frozen phonon multislice image simulations[9] are then used to investigate the range of imaging and specimen conditions over which this method can be applied. The contrast for the ABF mode is found to be robust within a ±2 nm defocus range and not sensitive to specimen thickness up to 40 nm (Fig.2), consistent with the previous work.[10] Other factors such as sample mistilt will be also discussed. Finally, different OOR systems with different rotation angles are studied to estimate the detection range with given microscope conditions. The prospects for using this technique on superlattices of materials with distinct tilt systems will also be discussed. [1] Rondinelli, JM et al., Adv Mater (2012) [2] Johnson-Wilke RL et al., PRB (2013) [3] Kirkland, AI et al., Ultramicroscopy (2007) [4] Kim YM et al., Adv Mater 25 (2013) [5] Okunishi, E et al., Micron (2012) [6] Levin I et al., Adv Funct Mater (2012) [7] Woodward, DI et al., Acta Crystallogr B (2005) [8] J. Hwang et al., PRB (2013) [9] Kirkland EJ, Advanced Computing in Electron Microscopy [10] Findlay, SD et al., Ultramicroscopy (2010)