Abstract:Characterization of materials via electron micrographs is an important and challenging task in several materials processing industries. Classification of electron micrographs is complex due to the high intra-class dissimilarity, high inter-class similarity, and multi-spatial scales of patterns. However, existing methods are ineffective in learning complex image patterns. We propose an effective end-to-end electron micrograph representation learning-based framework for nanomaterial identification to overcome the challenges. We demonstrate that our framework outperforms the popular baselines on the open-source datasets in nanomaterials-based identification tasks. The ablation studies are reported in great detail to support the efficacy of our approach.
What problem does this paper attempt to address?
This paper attempts to solve several key problems in the classification of electron microscopic images, which are particularly prominent in the task of nanomaterial identification. Specifically, the authors aim to solve the following problems:
1. **High intra - class variance and high inter - class similarity**: The intra - class variance of electron microscopic images is large, while the similarity between different classes is high, which complicates the classification task.
2. **Multi - scale pattern recognition**: Electron microscopic images contain patterns on multiple spatial scales, which pose a challenge to existing methods.
3. **Limitations of existing methods**: Traditional convolutional neural networks (CNNs), vision transformers (ViTs) and graph neural networks (GNNs) have deficiencies in learning complex image patterns, especially when dealing with small - scale datasets.
To solve these problems, the authors propose a new framework - EMCNet (Electron Micrographs Classification Network), which is based on graph neural networks (Graph - Nets) and is used for the identification of nanomaterials. EMCNet improves existing methods in the following ways:
- **Multi - scale representation learning**: Learn multi - scale patterns through the Hierarchical Graph Encoder (HGEnc) to improve the understanding of complex image structures.
- **Local information preservation**: By introducing position embeddings, the local information of image patches is preserved, enhancing the representational ability of the model.
- **Global information propagation**: By introducing a virtual master node, the propagation of global information is promoted, helping the model better capture long - range dependencies in the image.
- **Tree decomposition and sub - graph encoding**: Convert the graph into a tree structure through tree decomposition and further extract local sub - structure information using the Clique Tree Encoder (CTEnc).
In summary, the main goal of this paper is to develop an effective end - to - end framework to overcome the limitations of existing methods in the classification of electron microscopic images of nanomaterials, thereby achieving more accurate classification performance.