Rapid infrared imaging for rhombohedral graphene

Zuo Feng,Wenxuan Wang,Yilong You,Yifei Chen,Kenji Watanabe,Takashi Taniguchi,Chang Liu,Kaihui Liu,Xiaobo Lu
2024-08-19
Abstract:The extrinsic stacking sequence based on intrinsic crystal symmetry in multilayer two-dimensional materials plays a significant role in determining their electronic and optical properties. Compared with Bernal-stacked (ABA) multilayer graphene, rhombohedral (ABC) multilayer graphene hosts stronger electron-electron interaction due to its unique dispersion at low-energy excitations and has been utiliazed as a unique platform to explore strongly correlated physics. However, discerning the stacking sequence has always been a quite time-consuming process by scanning mapping methods. Here, we report a rapid recognition method for ABC- stacked graphene with high accuracy by infrared imaging based on the distinct optical responses at infrared range. The optical contrast of the image between ABC and ABA stacked graphene is strikingly clear, and the discernibility is comparable to traditional optical Raman microscopy but with higher consistency and throughput. We further demonstrate that the infrared imaging technique can be integrated with dry transfer techniques commonly used in the community. This rapid and convenient infrared imaging technique will significantly improve the sorting efficiency for differently stacked multilayer graphene, thereby accelerating the exploration of the novel emergent correlated phenomena in ABC stacked graphene.
Mesoscale and Nanoscale Physics,Materials Science
What problem does this paper attempt to address?
The main problem that this paper attempts to solve is to develop a fast, efficient and accurate method to identify the ABC (rhombohedral) stacking sequence in multilayer graphene. Compared with traditional scanning mapping methods, this method can significantly improve the identification speed and efficiency. ### Specific Problem Description 1. **Limitations of Traditional Methods**: - Traditional scanning mapping methods (such as scanning near - field optical microscopy, Raman spectroscopy scanning, scanning Kelvin probe microscopy, etc.) can identify the stacking sequence of graphene, but these methods are very time - consuming and difficult to be widely promoted in practical applications. - During the preparation process, the ABC stacking sequence is prone to transform into the lower - energy Bernal (ABA) stacking sequence, which increases the identification difficulty. 2. **Importance of ABC - Stacked Graphene**: - Due to its unique low - energy excitation dispersion characteristics, ABC - stacked multilayer graphene exhibits stronger electron - electron interactions and is an important platform for exploring strongly correlated physical phenomena. - In recent years, a variety of novel correlated phenomena have been observed in ABC - stacked graphene systems, such as Mott insulators, layer - polarized antiferromagnetic insulators, superconductivity, Stoner ferromagnetism, orbital multiferroicity, integer - quantum - Hall insulators and fractional - quantum - Hall insulators, etc. ### Solution The paper proposes a fast identification method based on infrared imaging technology, which has the following characteristics: - **High Resolution**: Infrared imaging technology can provide high - quality images in the infrared band with a resolution reaching the sub - micron level. - **High Contrast**: The optical responses of ABC - stacked and ABA - stacked graphene in the infrared range are significantly different, and the image contrast is clear. - **High Consistency**: Compared with traditional Raman spectroscopy mapping, infrared imaging technology has higher consistency and throughput. - **Strong Applicability**: This technology is not only applicable to bare graphene samples, but also can be used for graphene samples encapsulated by hBN, so as to monitor the changes of the stacking sequence in real - time during the assembly process. ### Experimental Verification Through experiments, the research team successfully used this infrared imaging technology to identify and select pure ABC - stacked regions, and then prepared four high - quality ABC - stacked graphene devices with different numbers of layers (from 3 to 6 layers). These devices exhibited the characteristic physical phenomena of ABC - stacked graphene, further verifying the effectiveness and reliability of this technology. ### Conclusion The fast infrared imaging technology developed in this study will significantly improve the preparation efficiency of multilayer graphene devices and accelerate the exploration of emerging strongly correlated physical phenomena in ABC - stacked graphene.