Abstract:High spatial resolution is the goal of many imaging systems. While designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task, creating a complex speckle pattern with wavelength-limited spatial features is easily accomplished with a simple random diffuser. With this observation and the concept of near-field ptychography, we report a new imaging modality, termed near-field Fourier ptychography, to address high-resolution imaging challenges in both microscopic and macroscopic imaging settings. 'Near-field' refers to placing the object at a short defocus distance with a large Fresnel number. We project a speckle pattern with fine spatial features on the object instead of directly resolving the spatial features via a high-resolution lens. We then translate the object (or speckle) to different positions and acquire the corresponding images by using a low-resolution lens. A ptychographic phase retrieval process is used to recover the complex object, the unknown speckle pattern, and the coherent transfer function at the same time. In a microscopic imaging setup, we use a 0.12 numerical aperture (NA) lens to achieve an NA of 0.85 in the reconstruction process. In a macroscale photographic imaging setup, we achieve ~7-fold resolution gain by using a photographic lens. The collection optics do not determine the final achievable resolution; rather, the speckle pattern's feature size does. This is similar to our recent demonstration in fluorescence imaging settings (Guo et al., Biomed. Opt. Express, 9(1), 2018). The reported imaging modality can be employed in light, coherent X-ray, and transmission electron imaging systems to increase resolution and provide quantitative absorption and object phase contrast.

Information limit of 15 pm achieved with bright-field ptychography

Information Limit of 15 Picometers Achieved with Bright-Field Ptychography

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Surface wave illumination Fourier ptychographic microscopy.

Enhancing the performance of fluorescence emission difference microscopy using beam modulation

Local-orbital ptychography for ultrahigh-resolution imaging

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Introduction to Electron Ptychography for Materials Scientists

Breaking the Diffraction Barrier Using Fluorescence Emission Difference Microscopy

Electron ptychography of 2D materials to deep sub-ångström resolution

Super-resolution microscopy via ptychographic structured modulation of a diffuser

Near-field Fourier Ptychography: Super-Resolution Phase Retrieval Via Speckle Illumination.

Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes

Subwavelength Resolution Fourier Ptychography with Hemispherical Digital Condensers

Resolution-enhanced Fourier Ptychographic Microscopy Based on High-Numerical-aperture Illuminations.

Electronvolt energy resolution with broadband ptychography

Accelerated Fourier ptychographic diffraction tomography with sparse annular LED illuminations

Ptychographic Intensity Interferometry Imaging under Low Dynamic Ranges

High-speed Fourier Ptychographic Microscopy Based on Programmable Annular Illuminations

Diagonal Illumination Scheme for Fourier Ptychographic Microscopy: Resolution Doubling and Aliasing Minimization