Abstract:Photon counting radiation detectors have become an integral part of medical imaging modalities such as Positron Emission Tomography or Computed Tomography. One of the most promising detectors is the wide bandgap room temperature semiconductor detectors, which depends on the interaction gamma/x-ray photons with the detector material involves Compton scattering which leads to multiple interaction photon events (MIPEs) of a single photon. For semiconductor detectors like CdZnTeSe (CZTS), which have a high overlap of detected energies between Compton and photoelectric events, it is nearly impossible to distinguish between Compton scattered events from photoelectric events using conventional readout electronics or signal processing algorithms. Herein, we report a deep learning classifier CoPhNet that distinguishes between Compton scattering and photoelectric interactions of gamma/x-ray photons with CdZnTeSe (CZTS) semiconductor detectors. Our CoPhNet model was trained using simulated data to resemble actual CZTS detector pulses and validated using both simulated and experimental data. These results demonstrated that our CoPhNet model can achieve high classification accuracy over the simulated test set. It also holds its performance robustness under operating parameter shifts such as Signal-Noise-Ratio (SNR) and incident energy. Our work thus laid solid foundation for developing next-generation high energy gamma-rays detectors for better biomedical imaging.

What problem does this paper attempt to address?

The paper primarily investigates the classification of gamma photon interactions in room-temperature semiconductor radiation detectors. Specifically, the paper addresses the following key issues: 1. **Background and Challenges**: - Semiconductor detectors (especially CdZnTeSe (CZTS)) play a crucial role in medical imaging technologies such as Positron Emission Tomography (PET) and Computed Tomography (CT). - When gamma rays interact with the detector material, they produce two types of events: Compton scattering and photoelectric effect, leading to multiple interaction photon events (MIPEs). - For semiconductor detectors like CZTS, the energy overlap between Compton scattering events and photoelectric events is significant, making it difficult for traditional readout electronics or signal processing algorithms to distinguish between these two types of events. 2. **Solution**: - A deep learning-based classifier, CoPhNet, is proposed to distinguish between gamma/X-ray photon interactions with CZTS semiconductor detectors caused by Compton scattering and the photoelectric effect. - The CoPhNet model is trained using simulated data and validated with both simulated and experimental data. - Results show that the CoPhNet model achieves high classification accuracy and maintains good robustness under varying signal-to-noise ratios (SNR) and incident energies. 3. **Methodology**: - **Dataset Preparation**: Training datasets are generated using the Monte Carlo simulation algorithm in MATLAB, considering the effects of charge trapping and front-end readout electronics to simulate the actual CZTS detection system. - **Neural Network Architecture**: A multilayer perceptron (MLP) structure is adopted, including an input layer, three hidden layers, and an output layer. The input layer contains 500 nodes corresponding to the dimensions of the input pulse; each of the three hidden layers contains 64 nodes; the output layer contains 2 nodes representing the probabilities of photoelectric events and Compton scattering events. - **Training Strategy**: A 10-fold cross-validation method is used for training to ensure the reliability and generalization ability of the model performance evaluation. - **Visualization Techniques**: t-SNE technology is used to perform dimensionality reduction visualization of the neural network's internal feature vectors, facilitating the understanding and exploration of complex relationships and clustering within the data. 4. **Results and Evaluation**: - The classification accuracy reached 100% on both the training and test sets, indicating very high predictive accuracy of the model. - t-SNE visualization results show that sample points of photoelectric events and Compton scattering events are clearly separated in the feature space, further confirming the model's effectiveness and feature extraction capability. In summary, the CoPhNet model proposed in this study can effectively distinguish between Compton scattering and photoelectric events in CZTS semiconductor detectors, providing a new solution to improve the performance of medical imaging technologies.

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