Light-enhanced van der Waals force microscopy

Han Yu-Xiao,Bai Benfeng,Zhang Jian-Yu,Huang Jia-Tai,Feng Peng-Yi,Sun Hong-Bo

2023-10-19

Abstract:Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample separations, resulting in the difficulty of compositional identification, even under multi-modal strategies and other AFM variations. Here, we report a phenomenon of light enhancement of van der Waals force (LvF), and the enhancement factor is found specific to materials. The force difference prior and after illumination, instead of the tip-specimen force itself, is employed for discriminating heterogeneous phases. The corresponding LvF microscopy (LvFM) demonstrates not only a ultra-high compositional resolution represented by 20 dB enhancement factor and 150 times of the detection limit, but also a sub-10 nm lateral spatial resolution much smaller than the tip size of 20 nm. The simplicity of the opto-thermal mechanism, minuteness of excitation light power and wide availability of boosting lasers at various wavelengths imply broad applications of LvFM on nano-materials characterization, particularly on two-dimensional semiconductors that are promising as new generation of chip materials.

Optics,Materials Science

What problem does this paper attempt to address?

This paper attempts to address the difficulties faced by Atomic Force Microscopy (AFM) in identifying material composition. Specifically, AFM typically relies on van der Waals forces (vdW forces) to measure force and map surface topography, but these forces are more sensitive to changes in tip-sample distance than to changes in atomic species. This leads to challenges in composition identification under ambient conditions. To solve this problem, researchers have proposed a new phenomenon—Light-enhanced van der Waals Forces (LvF), and developed a novel microscopy technique—Light-enhanced van der Waals Force Microscopy (LvFM) by utilizing this phenomenon. This method achieves ultra-high compositional resolution and sub-10 nanometer spatial resolution by detecting changes in force before and after illumination, rather than directly measuring the force between the tip and the sample. Additionally, this method has low laser power requirements and effectiveness over a wide spectral range, making it particularly suitable for characterizing nanomaterials such as two-dimensional semiconductors.