3D-imaging of Printed Nanostructured Networks using High-resolution FIB-SEM Nanotomography

Cian Gabbett,Luke Doolan,Kevin Synnatschke,Laura Gambini,Emmet Coleman,Adam G. Kelly,Shixin Liu,Eoin Caffrey,Jose Munuera,Catriona Murphy,Stefano Sanvito,Lewys Jones,Jonathan N. Coleman

DOI: https://doi.org/10.48550/arXiv.2301.11046

2023-01-26

Abstract:Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morphology plays a dominant role in determining the physical properties of printed networks, it remains difficult to quantify network structure. Here, we utilise FIB-SEM nanotomography to characterise the morphology of nanostructured networks. Nanometer-resolution 3D-images were obtained from printed networks of graphene nanosheets of various sizes, as well as networks of WS2 nanosheets, silver nanosheets and silver nanowires. Important morphological characteristics, including network porosity, tortuosity, pore dimensions and nanosheet orientation were extracted and linked to network resistivity. By extending this technique to interrogate the structure and interfaces within vertical printed heterostacks, we demonstrate the potential of this technique for device characterisation and optimisation.

Mesoscale and Nanoscale Physics,Materials Science

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to quantitatively characterize the microstructure morphology of networks composed of two - dimensional (2D) and one - dimensional (1D) nanomaterials. Specifically, the authors used high - resolution focused ion beam - scanning electron microscope nanotomography (FIB - SEM nanotomography) to perform three - dimensional imaging on printed nanostructure networks and extract important morphological features from them, such as network porosity, tortuosity, pore size, and nanosheet orientation.

### Specific background of the problem

Solution - processed nanomaterial networks have broad application potential in fields such as electronics, sensing, and energy storage/generation. However, the physical properties of these networks are highly dependent on their microstructure morphology, and existing characterization methods are difficult to provide sufficient resolution and quantitative information to describe these complex nanostructures. For example:

- **Limitations of standard techniques**: Traditional mercury intrusion porosimetry (MIP) and nitrogen adsorption BET analysis require a large sample volume and can only provide surface information.
- **Deficiencies of existing 3D imaging techniques**: X - ray computed tomography (X - ray CT) has limited resolution and cannot meet the fine characterization requirements of nanomaterial network structures.

### Research objectives

To overcome the above problems, the authors introduced FIB - SEM nanotomography technology, aiming to achieve the following objectives:

1. **High - resolution 3D imaging**: Obtain three - dimensional images at the nanoscale through FIB - SEM technology to accurately characterize the internal structure of nanomaterial networks.
2. **Quantitative analysis of morphological features**: Extract key morphological parameters from 3D images, such as porosity, tortuosity, pore size distribution, and nanosheet orientation.
3. **Correlate structure and performance**: Link the extracted morphological features to the electrical properties of the network (such as resistivity) to reveal the mechanism by which structure affects performance.
4. **Expand the application range**: Verify the applicability of this technology in different material systems, including graphene, WS₂ nanosheets, silver nanosheets, and silver nanowires.

Through these studies, the authors hope to provide a scientific basis for optimizing the design and preparation of nanomaterial networks, thereby promoting the improvement of the performance of related devices.