Abstract:Robotized wire-laser directed energy deposition (DED) is a highly anticipated technology with excellent material utilization and deposition efficiency for fabricating complex-structure metal parts. Nevertheless, the immaturity of the monitoring and control techniques for the deposition process stability are the main challenges in achieving automatic and repeatable manufacturing of metal parts. This study proposes a novel approach to monitor the process stability, i.e., the intersection point between the laser beam and the wire to the top layer distance (IPTD), in robotic wire-laser DED based on a designed multi-modal IPTD estimation model and coaxial visual sensing. The novelty is that directly extracting deposition height features from coaxial molten pool images is attempted based on deep learning. In particular, the designed multi-modal IPTD estimation model, consisting of a convolutional neural network (CNN) part and a fully connected network, combines the features of molten pool images and process parameters to estimate the IPTD state. Six model architectures and three image pixel sizes are used in the IPTD classification tasks to determine the CNN part architecture and the input image pixel size of the multi-modal deep learning model based on classification results. The regression performances of established single-modal and multi-modal IPTD estimation models are studied and discussed. Compared to other model architectures, the ResNet-18 model possesses the highest convergence rate during training and the best classification accuracy of 0.9975 on the testing dataset with the image pixel size of 180 × 105. The fitting accuracy and generalization performance of the multi-modal IPTD estimation model are marked superior to the single-modal IPTD estimation model. Validation experiments reveal the effectiveness of the proposed monitoring approach of process stability. This study will lay a solid foundation for the future control of process stability in robotic wire-laser DED.

Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning

Universal Deoxidation of Semiconductor Substrates Assisted by Machine-Learning and Real-Time-Feedback-Control

Machine-learning-assisted analysis of transition metal dichalcogenide thin-film growth

Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction

Study on Temperature Calibration and Surface Phase Transition of Gaas Crystal Substrate in Mbe Growth by Rheed Real-Time Monitoring

Dynamical Calculations of RHEED Intensity Evolution During MBE Growth

Dynamical RHEED from MBE Growing Surfaces

The Research on Growth of GaAs under the Monitoring of RHEED

Real-time monitoring and quality assurance for laser-based directed energy deposition: integrating co-axial imaging and self-supervised deep learning framework

A machine learning approach to map crystal orientation by optical microscopy

Rapid screening of molecular beam epitaxy conditions for monoclinic (InxGa1-x)2O3 alloys

Machine learning analysis of perovskite oxides grown by molecular beam epitaxy

Rapid screening of molecular beam epitaxy conditions for monoclinic (In x Ga 1− x ) 2 O 3 alloys

In-situ monitoring laser based directed energy deposition process with deep convolutional neural network

Deep learning-based monitoring of surface residual stress and efficient sensing of AE for laser shock peening

In-situ Monitoring of Si and SiGe Growth on Si(001) Surfaces During Gas-Source Molecular Beam Epitaxy Using Reflectance Anisotropy

Online melt pool depth estimation during directed energy deposition using coaxial infrared camera, laser line scanner, and artificial neural network

Monitoring process stability in robotic wire-laser directed energy deposition based on multi-modal deep learning

Learning-based Defect Recognition for Quasi-Periodic Microscope Images

Dynamic Calculations for Rheed from Mbe Growing Surfaces .3. Heteroepitaxial Growth and Interface Formation

Dynamic STEM-EELS for single atom and defect measurement during electron beam transformations