Abstract:The transverse emittance of a charged particle beam is an important figure of merit for many accelerator applications, such as ultra-fast electron diffraction, free electron lasers and the operation of new compact accelerator concepts in general. One of the easiest to implement methods to determine the transverse emittance is the phase advance scan method using a focusing element and a screen. This method has been shown to work well in the thermal regime. In the space charge dominated laminar flow regime, however, the scheme becomes difficult to apply, because of the lack of a closed description of the beam envelope including space charge effects. Furthermore, certain mathematical, as well as beamline design criteria must be met in order to ensure accurate results. In this work we show that it is possible to analyze phase advance scan data using a fully connected neural network (FCNN), even in setups, which do not meet these criteria. In a simulation study, we evaluate the perfomance of the FCNN by comparing it to a traditional fit routine, based on the beam envelope equation. Subsequently, we use a pre-trained FCNN to evaluate measured phase advance scan data, which ultimately yields much better agreement with numerical simulations. To tackle the confirmation bias problem, we employ additional mask-based emittance measurement techniques.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the difficulty in using the phase - advance scanning technique to measure the transverse emittance in space - charge - dominated beams. Specifically: 1. **Influence of space - charge effect**: In space - charge - dominated beams, the traditional phase - advance scanning method is difficult to apply because there is no complete beam - envelope description, especially when the beam is in the laminar flow regime. This results in the poor performance of the traditional method in the case of high space - charge parameter \(\rho \gg 1\). 2. **Mathematical and beam - line design requirements**: To ensure accurate results, the traditional phase - advance scanning method needs to meet certain mathematical and beam - line design criteria. For example, the following two conditions need to be met: - Mathematical condition: \(\frac{\epsilon_x^2}{\sigma_{x,0}^2} \cdot (\sigma_{x,0}')^2 \geq 0.01\). - Physical condition: The scanning range must include a minimum value, that is, the focal position. This means that the initial beam - optical design needs to ensure that the focus is located behind the measurement screen and that the focusing element is strong enough to focus the beam onto the screen. 3. **Limitations of existing methods**: The traditional method based on the beam - envelope equation has multiple problems in the case of \(\rho \gg 1\), including: - The model is only applicable to perfect cylindrical beams. - The form factor \(G\) depends on the aspect ratio of the beam, and the aspect ratio is not a constant in the experiment. - The nonlinear space - charge force is ignored in this method. - The penetration - force term depends on the beam length, and it may not be accurately measured in the experiment. - The beam - envelope equation cannot be solved analytically and needs to be approximated by a polynomial series. To solve these problems, the author proposes a new method of analyzing phase - advance scanning data using a fully - connected neural network (FCNN). Through simulation studies and actual data tests, it is verified that this method can still effectively predict the transverse emittance in the case of \(\rho \gg 1\) and when the above - mentioned mathematical conditions are not met.

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