Semiconductors and Dirichlet-to-Neumann maps

A. Leitao
DOI: https://doi.org/10.1590/S0101-82052006000200005
2021-01-23
Abstract:We investigate the problem of identifying discontinuous doping profiles in semiconductor devices from data obtained by the stationary voltage-current (VC) map. The related inverse problem correspond to the inverse problem for the Dirichlet-to-Neumann (DN) map with partial data.
Analysis of PDEs,Numerical Analysis
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