Characterization of Field Emission from Oxidized Copper Emitters

Marwan S. Mousa,Saleh R. R. Al-Bashaish,Mazen A. Madanat,Ammar Alsoud,Ali F. AlQaisi,Mohammed A. Al-Anber,Azeez A. Barzinjy,Enas A. Arrasheed,Adel abuamro,Ahmad M. D. (Assa'd) Jaber,Dinara Sobola
DOI: https://doi.org/10.1088/1402-4896/ad7232
2024-08-24
Physica Scripta
Abstract:In this work, field emission electron measurements were performed on high-purity copper emitters with radii in the 80-250 nm range, using the electrochemical etching method with phosphoric acid solution (H3PO4). An oxide layer was formed on the surface of the emitters due to aging (long exposure to air before testing). Measurements were performed under high vacuum conditions in the range of 10-6 mbar. The current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) type plots and the orthodoxy test. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to study the emitter surface, the purity of the samples, and detect the oxide layer. Furthermore, the spatial distribution of electron emission and current stability were recorded and used to analyse the electron emission behaviour of the tip surface. The results showed that the emitters passed the orthodoxy test at low voltages. The role that traps play in the switch- on phenomenon has been clarified. The emission current started at low voltages and showed a bright oscillating spatial distribution due to the charging and discharging process of electrons from the traps.
physics, multidisciplinary
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