Multilayer InSe-Te van der Waals heterostructures with ultrahigh rectification ratio and ultrasensitive photoresponse

Fanglu Qin,Feng Gao,Mingjin Dai,Yunxia Hu,Miaomiao Yu,Lifeng Wang,PingAn Hu,Wei Feng
DOI: https://doi.org/10.1021/acsami.0c08461
2020-01-21
Abstract:Multilayer van der Waals (vdWs) semiconductors have great promising application in high-performance optoelectronic devices. However, the photoconductive photodetectors based on layered semiconductors often suffer from large dark current and high external driven bias voltage. Here, we report a vertical van der Waals heterostructures (vdWHs) consisting of multilayer indium selenide (InSe) and tellurium (Te). The multilayer InSe-Te vdWHs device shows a record high forward rectification ratio greater than 107 at room temperature. Furthermore, an ultrasensitive and broadband photoresponse photodetector is achieved by the vdWHs device with an ultrahigh photo/dark current ratio over 104, a high detectivity of 1013, and a comparable responsivity of 0.45 A/W under visible light illumination with weak incident power. Moreover, the vdWHs device has a photovoltaic effect and can function as a self-powered photodetector (SPPD). The SPPD is also ultrasensitive to the broadband spectra ranging from 300 nm to 1000 nm and is capable of detecting weak light signals. This work offers an opportunity to develop next-generation electronic and optoelectronic devices based on multilayer vdWs structures.
Applied Physics,Mesoscale and Nanoscale Physics,Materials Science
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