Abstract:The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However, the use of new detectors optimized for electron diffraction patterns and other advanced techniques requires constant adaptation of methodologies to address the challenges associated with crystalline materials. In this study, we present a novel image-processing method to improve pattern matching in the determination of crystalline orientations and phases. Our approach uses sub-pixel adaptive image processing to register and reconstruct electron diffraction signals in large 4D-STEM datasets. By using adaptive prominence and linear filters, we can improve the quality of the diffraction pattern registration. The resulting data compression rate of 10 3 is well-suited for the era of big data and provides a significant enhancement in the performance of the entire ACOM data processing method. Our approach is evaluated using dedicated metrics, which demonstrate a high improvement in phase recognition. Several features are extracted from the registered data to map properties such as the spot count, and various virtual dark fields, which are used to enhance the handling of the results maps. Our results demonstrate that this data preparation method not only enhances the quality of the resulting image but also boosts the confidence level in the analysis of the outcomes related to determining crystal orientation and phase. Additionally, it mitigates the impact of user bias that may occur during the application of the method through the manipulation of parameters.

Dose-efficient strain mapping with high precision and throughput using cepstral transforms on 4D-STEM data

Two-Dimensional Strain Mapping with Scanning Precession Electron Diffraction: An Investigation into Data Analysis Routines

High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities

Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope

Enhancement of leaching copper by electro-oxidation from metal powders of waste printed circuit board.

Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

In vitro eye irritation testing using the open source reconstructed hemicornea - a ring trial.

Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques

Improved ACOM pattern matching in 4D-STEM through adaptive sub-pixel peak detection and image reconstruction

Advanced Compressive Sensing and Dynamic Sampling for 4D-STEM Imaging of Interfaces

Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials

Adaptative Diffraction Image Registration for 4D-STEM to optimize ACOM Pattern Matching

Case of hepatolithiasis diagnosed by magnetic resonance cholangiography.

From STEM to 4D STEM: Ultrafast Diffraction Mapping with a Hybrid-Pixel Detector

Uncovering Material Deformations via Machine Learning Combined with Four-Dimensional Scanning Transmission Electron Microscopy

Nanoscale diffractive probing of strain dynamics in ultrafast transmission electron microscopy

A New Residual Strain Mapping Program Using Energy Dispersive X-Ray Diffraction at the Advanced Photon Source

Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy

Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization