Abstract:The evolution of superconducting quantum processors is driven by the need to reduce errors and scale for fault-tolerant computation. Reducing physical qubit error rates requires further advances in the microscopic modeling and control of decoherence mechanisms in superconducting qubits. Piezoelectric interactions contribute to decoherence by mediating energy exchange between microwave photons and acoustic phonons. Centrosymmetric materials like silicon and sapphire do not display piezoelectricity and are the preferred substrates for superconducting qubits. However, the broken centrosymmetry at material interfaces may lead to piezoelectric losses in qubits. While this loss mechanism was predicted two decades ago, interface piezoelectricity has not been experimentally observed in superconducting devices. Here, we report the observation of interface piezoelectricity at an aluminum-silicon junction and show that it constitutes an important loss channel for superconducting devices. We fabricate aluminum interdigital surface acoustic wave transducers on silicon and demonstrate piezoelectric transduction from room temperature to millikelvin temperatures. We find an effective electromechanical coupling factor of $K^2\approx 2 \times 10^{-5}\%$ comparable to weakly piezoelectric substrates. We model the impact of the measured interface piezoelectric response on superconducting qubits and find that the piezoelectric surface loss channel limits qubit quality factors to $Q\sim10^4-10^8$ for designs with different surface participation ratios and electromechanical mode matching. These results identify electromechanical surface losses as a significant dissipation channel for superconducting qubits, and show the need for heterostructure and phononic engineering to minimize errors in next-generation superconducting qubits.

Phononic loss in superconducting resonators on piezoelectric substrates

Loss Dependence on Geometry and Applied Power in Superconducting Coplanar Resonators

Interplay of coupling, residual, and quasiparticle losses for the frequency- and temperature-dependent quality factor of superconducting resonators

Substrate and process dependent losses in superconducting thin film resonators

Characterization of Acoustic Losses in Interdigitated VHF to mmWave Piezoelectric M/NEMS Resonators

Thin-film quartz for high-coherence piezoelectric phononic crystal resonators

Power and temperature dependent model for High Q superconductors

Determining interface dielectric losses in superconducting coplanar waveguide resonators

Observation of Interface Piezoelectricity in Superconducting Devices on Silicon

Loss mechanisms in superconducting thin film microwave resonators

Characterization of process-related interfacial dielectric loss in aluminum-on-silicon by resonator microwave measurements, materials analysis, and imaging

Geometric Scaling of Two-Level-System Loss in Superconducting Resonators

Identification and Mitigation of Conducting Package Losses for Quantum Superconducting Devices

Materials loss measurements using superconducting microwave resonators

Quality Factor Enhancement of Piezoelectric MEMS Resonator Using a Small Cross-Section Connection Phononic Crystal

High-Q trenched aluminum coplanar resonators with an ultrasonic edge microcutting for superconducting quantum devices

Superconducting Resonators with Parasitic Electromagnetic Environments

Temperature dependence of microwave losses in lumped-element resonators made from superconducting nanowires with high kinetic inductance

Surface acoustic wave resonators on thin film piezoelectric substrates in the quantum regime